Surface topography measurement based on color images processing in white light interferometry

2015 ◽  
Author(s):  
Tong Guo ◽  
Yue Gu ◽  
Jinping Chen ◽  
Xing Fu ◽  
Xiaotang Hu
Keyword(s):  
Surface Topography ◽  
White Light ◽  
Color Images ◽  
White Light Interferometry ◽  
Images Processing

Microstructure Surface Topography Measurement Based on Color Images of White Light Interferometry

2014 ◽  
Vol 34 (2) ◽  
pp. 0212003
Author(s):  
郭彤 Guo Tong ◽  
李峰 Li Feng ◽  
倪连峰 Ni Lianfeng ◽  
陈津平 Chen Jinping ◽  
傅星 Fu Xing ◽  
...  
Keyword(s):  
Surface Topography ◽  
White Light ◽  
Color Images ◽  
White Light Interferometry

High-Resolution Surface Topography Measurement Based on Frequency-Domain Analysis in White Light Interferometry

2018 ◽  
Vol 45 (6) ◽  
pp. 0604001
Author(s):  
邓钦元 Deng Qinyuan ◽  
唐燕 Tang Yan ◽  
周毅 Zhou Yi ◽  
杨勇 Yang Yong ◽  
胡松 Hu Song
Keyword(s):  
High Resolution ◽  
Frequency Domain ◽  
Surface Topography ◽  
White Light ◽  
Domain Analysis ◽  
Frequency Domain Analysis ◽  
White Light Interferometry

Measurement of microscopic surface topography of alloy dimple fracture by scanning white-light interferometry

2011 ◽  
Vol 19 (7) ◽  
pp. 1612-1619
Author(s):  
邹文栋 ZOU Wen-dong ◽  
黄长辉 HUANG Chang-hui ◽  
郑玱 ZHENG Qiang ◽  
徐周珏 XU Zhou-jue ◽  
董娜 DONG Na
Keyword(s):  
Surface Topography ◽  
White Light ◽  
White Light Interferometry ◽  
Dimple Fracture ◽  
Scanning White Light Interferometry ◽  
Microscopic Surface

Fringe order identification in optical fibre white-light interferometry using centroid algorithm method

1992 ◽  
Vol 28 (6) ◽  
pp. 553 ◽  
Author(s):  
S. Chen ◽  
A.W. Palmer ◽  
K.T.V. Grattan ◽  
B.T. Meggitt
Keyword(s):  
Optical Fibre ◽  
White Light ◽  
White Light Interferometry ◽  
Fringe Order ◽  
Centroid Algorithm

scholarly journals Integrated, Speckle-Based Displacement Measurement for Lateral Scanning White Light Interferometry

Sensors ◽  
2021 ◽  
Vol 21 (7) ◽  
pp. 2486
Author(s):  
Gert Behrends ◽  
Dirk Stöbener ◽  
Andreas Fischer
Keyword(s):  
White Light ◽  
Lateral Displacement ◽  
Displacement Measurement ◽  
Accurate Information ◽  
White Light Interferometry ◽  
Fully Integrated ◽  
Speckle Correlation ◽  
Dsc Measurements ◽  
Scanning White Light Interferometry ◽  
The Impact

Lateral scanning white light interferometry (LSWLI) is a promising technique for high-resolution topography measurements on moving surfaces. To achieve resolutions typically associated with white light interferometry, accurate information on the lateral displacement of the measured surface is essential. Since the uncertainty requirement for a respective displacement measurement is currently not known, Monte Carlo simulations of LSWLI measurements are carried out at first to assess the impact of the displacement uncertainty on the topography measurement. The simulation shows that the uncertainty of the displacement measurement has a larger influence on the total height uncertainty than the uncertainty of the displacing motion itself. Secondly, a sufficiently precise displacement measurement by means of digital speckle correlation (DSC) is proposed that is fully integrated into the field of view of the interferometer. In contrast to externally applied displacement measurement systems, the integrated combination of DSC with LSWLI needs no synchronization and calibration, and it is applicable for translatory as well as rotatory scans. To demonstrate the findings, an LSWLI setup with integrated DSC measurements is realized and tested on a rotating cylindrical object with a surface made of a linear encoder strip.

Polarization insensitive fibre-optic white-light interferometry

1995 ◽  
Vol 114 (5-6) ◽  
pp. 386-392 ◽  
Author(s):  
L.A Ferreira ◽  
J.L Santos ◽  
F Farahi
Keyword(s):  
White Light ◽  
Fibre Optic ◽  
White Light Interferometry ◽  
Polarization Insensitive
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