Scanning near-field optical microscope for characterization of single mode fibers

Characterization of near-field optical microscope probes

Surface and Interface Analysis ◽

10.1002/sia.2784 ◽

2008 ◽

Vol 40 (3-4) ◽

pp. 482-485 ◽

Cited By ~ 1

Author(s):

Petr Klapetek ◽

Miroslav Valtr ◽

Petr Klenovský ◽

Jiří Buršík

Keyword(s):

Near Field ◽

Optical Microscope

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Characterization of Imaging of Localized Surface Reactions with Probe Microscopy. Near-Field Optical Microscope for Surface Imaging and Analysis.

Journal of The Surface Finishing Society of Japan ◽

10.4139/sfj.51.53 ◽

2000 ◽

Vol 51 (1) ◽

pp. 53-58

Author(s):

Hiroshi MURAMATSU ◽

Noritaka YAMAMOTO

Keyword(s):

Near Field ◽

Surface Reactions ◽

Optical Microscope ◽

Surface Imaging ◽

Probe Microscopy

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Probes for a scanning near-field optical microscope on the base tapered single-mode optical fiber

Proceedings of CAOL'2003. 1st International Conference on Advanced Optoelectronics and Lasers. Jontly with 1st Workshop on Precision Oscillations in Electronics and Optics (IEEE Cat. No.03EX715) ◽

10.1109/caol.2003.1251256 ◽

2004 ◽

Author(s):

V.F. Dryakhtushin ◽

A.Yu. Klimov ◽

V.V. Rogov

Keyword(s):

Optical Fiber ◽

Near Field ◽

Single Mode ◽

Optical Microscope ◽

Single Mode Optical Fiber

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Probes for a scanning near-field optical microscope on the base single-mode fiber

Proceedings of 2002 4th International Conference on Transparent Optical Networks (IEEE Cat. No.02EX551) ◽

10.1109/icton.2002.1009542 ◽

2003 ◽

Author(s):

V.F. Dryakhlushin ◽

A.Yu. Klimov ◽

V.V. Rogov

Keyword(s):

Near Field ◽

Single Mode ◽

Optical Microscope ◽

Single Mode Fiber

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Characterization of silicon micro-optic structures with a near-infrared Near-field Scanning Optical Microscope

Frontiers in Optics ◽

10.1364/fio.2006.ftut5 ◽

2006 ◽

Author(s):

Webin Chen ◽

Lirong Sun ◽

Andrew Sarangan ◽

Qiwen Zhan

Keyword(s):

Near Infrared ◽

Near Field ◽

Optical Microscope ◽

Near Field Scanning

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Characterization of carbon nano-materials by apertureless near-field scanning optical microscope-Raman spectroscopy

10.1117/12.931647 ◽

2012 ◽

Author(s):

Kyoung-Duck Park ◽

Yong Hwan Kim ◽

Jin Ho Park ◽

Jung Su Park ◽

Young-Hee Lee ◽

...

Keyword(s):

Raman Spectroscopy ◽

Near Field ◽

Optical Microscope ◽

Nano Materials ◽

Near Field Scanning

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Polarization-sensitive characterization of the propagating plasmonic modes in silver nanowire waveguide on a glass substrate with a scanning near-field optical microscope

Optics Express ◽

10.1364/oe.21.015247 ◽

2013 ◽

Vol 21 (13) ◽

pp. 15247 ◽

Cited By ~ 9

Author(s):

Priyamvada Venugopalan ◽

Qiming Zhang ◽

Xiangping Li ◽

Min Gu

Keyword(s):

Glass Substrate ◽

Near Field ◽

Optical Microscope ◽

Silver Nanowire

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Probes for a scanning near-field optical microscope on the base of tapered single-mode optical fiber

10.1117/12.583463 ◽

2004 ◽

Cited By ~ 2

Author(s):

V. F. Dryakhlushin ◽

Alexander Y. Klimov ◽

Vladimir Rogov

Keyword(s):

Optical Fiber ◽

Near Field ◽

Single Mode ◽

Optical Microscope ◽

Single Mode Optical Fiber

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Scanning near-field optical microscope for the characterization of optical integrated waveguides

Journal of Lightwave Technology ◽

10.1109/50.827509 ◽

2000 ◽

Vol 18 (3) ◽

pp. 370-374 ◽

Cited By ~ 12

Author(s):

X. Borrise ◽

D. Jimenez ◽

N. Barniol ◽

F. Perez-Murano ◽

X. Aymerich

Keyword(s):

Near Field ◽

Optical Microscope

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DESIGN AND CONSTRUCTION OF A SHORT-TIP TAPPING-MODE TUNING FORK NEAR-FIELD SCANNING OPTICAL MICROSCOPE

International Journal of Nanoscience ◽

10.1142/s0219581x03001231 ◽

2003 ◽

Vol 02 (04n05) ◽

pp. 225-230

Author(s):

CHIEN-WEN HUANG ◽

NIEN-HUA LU ◽

CHIH-YEN CHEN ◽

CHENG-FENG YU ◽

TSUNG-SHENG KAO ◽

...

Keyword(s):

Optical Microscopy ◽

Tuning Fork ◽

Near Field ◽

Single Mode ◽

Optical Microscope ◽

Sensing Element ◽

Tapping Mode ◽

Scanning Optical Microscopy ◽

Near Field Scanning ◽

Design And Construction

The design and construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides a stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples. We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on the endfaces of a single mode telecommunication optical fiber and a silica-based buried channel waveguide.

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