Characterization of silicon micro-optic structures with a near-infrared Near-field Scanning Optical Microscope
2002 ◽
Vol 13
(4)
◽
pp. 301-307
1986 ◽
Vol 44
◽
pp. 642-643
Keyword(s):
2003 ◽
Vol 74
(8)
◽
pp. 3889-3891
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Keyword(s):
2011 ◽
Vol 10
(04n05)
◽
pp. 623-627
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