Modeling the alternate bias configuration and low temperature C-V profiling in blocked impurity band detectors

2005 ◽  
Author(s):  
S. J. Tschanz ◽  
J. C. Garcia ◽  
N. M. Haegel
Keyword(s):  
Low Temperature ◽  
Impurity Band ◽  
Blocked Impurity Band Detectors

Si:Sb blocked impurity band detectors for infrared astronomy

1992 ◽  
Vol 72 (1) ◽  
pp. 273-275 ◽  
Author(s):  
James E. Huffman ◽  
A. G. Crouse ◽  
B. L. Halleck ◽  
T. V. Downes ◽  
Terry L. Herter
Keyword(s):  
Impurity Band ◽  
Infrared Astronomy ◽  
Blocked Impurity Band Detectors

Germanium Far Infrared Blocked Impurity Band Detectors

1997 ◽  
Vol 484 ◽  
Author(s):  
C. S. Olsen ◽  
J. W. Beeman ◽  
W. L. Hansen ◽  
E. E. Hallerab
Keyword(s):  
High Purity ◽  
Far Infrared ◽  
Impurity Band ◽  
Infrared Detection ◽  
Long Wavelength ◽  
Current Voltage ◽  
Heavily Doped ◽  
Absorbing Layer ◽  
Blocked Impurity Band Detectors ◽  
Long Wavelength Infrared

AbstractWe report on the development of Germanium Blocked Impurity Band (BIB) photoconductors for long wavelength infrared detection in the 100 to 250.μm region. Liquid Phase Epitaxy (LPE) was used to grow the high purity blocking layer, and in some cases, the heavily doped infrared absorbing layer that comprise theses detectors. To achieve the stringent demands on purity and crystalline perfection we have developed a high purity LPE process which can be used for the growth of high purity as well as purely doped Ge epilayers. The low melting point, high purity metal, Pb, was used as a solvent. Pb has a negligible solubility <1017 cm−3 in Ge at 650°C and is isoelectronic with Ge. We have identified the residual impurities Bi, P, and Sb in the Ge epilayers and have determined that the Pb solvent is the source. Experiments are in progress to purify the Pb. The first tests of BIB structures with the purely doped absorbing layer grown on high purity substrates look very promising. The detectors exhibit extended wavelength cutoff when compared to standard Ge:Ga photoconductors (155 μm vs. 120 μm) and show the expected asymmetric current-voltage dependencies. We are currently optimizing doping and layer thickness to achieve the optimum responsivity, Noise Equivalent Power (NEP), and dark current in our devices.

Electrical Properties of Heavily Be-doped GaAs grown by Molecular Beam Epitaxy

1989 ◽  
Vol 163 ◽  
Author(s):  
H. Shibata ◽  
Y. Makita ◽  
A. Yamada ◽  
N. Ohnishi ◽  
M. Mori ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Molecular Beam Epitaxy ◽  
Low Temperature ◽  
Carrier Concentration ◽  
Valence Band ◽  
Temperature Region ◽  
Room Temperature ◽  
Molecular Beam ◽  
Impurity Band ◽  
Carrier Scattering

AbstractElectrical properties of heavily Be-doped GaAs grown by molecular beam epitaxy were investigated systematically in a wide range of Be-concentration from 1× 1014 up to 2× 1020 cm-3 by using yan der Pauw technique. Probable carrier scattering mechanisms observed in this work are discussed by taking into account the radiative mechanisms of several new photoluminescence emissions previously observed in the band-edge-emission region of the samples. All samples were checked their electrical properties first at room-temperature. Five selected samples out of them were measured from 10° K up to room-temperature. Samples having the carrier concentration from 1014 to 1018 cm3 presented typical semiconductor-like conduction with finite carrier excitation energy. For samples having carrier concentration 7× 1016 cm -3, the conduction mechanism at high temperature region above 30β K was dominated by holes thermally excited into valence band. At low temperature region below 30° K . it was dominated by holes hopping from neutral to ionized acceptors with the assistance of phonons. Hole mobilities of samples having the carrier concentration from 1017 to 1018 cm-3 showed an anomalous behavior in the low temperature region, which suggests the presence of a new type of carrier scattering mechanism. A radiative center denoted by lg-gl observed in this concentration region will be a candidate scattering center to explain these electrical behaviors. Samples having the carrier concentration larger than 1019 cm-3 demonstrated typically metallic electric conduction not owing to thermally excited carriers, which means that an impurity band is formed but merged with valence band. The density of state of this combined valence band mixed with impurity band can be supposed to reflect carrier concentration dependence of the PL emission bands observed in this region, i.e. [g-g]α , [g-g]β and [g-g]γ .

Extended mode in blocked impurity band detectors for terahertz radiation detection

2014 ◽  
Vol 105 (14) ◽  
pp. 143501 ◽  
Author(s):  
K. S. Liao ◽  
N. Li ◽  
C. Wang ◽  
L. Li ◽  
Y. L. Jing ◽  
...  
Keyword(s):  
Terahertz Radiation ◽  
Radiation Detection ◽  
Impurity Band ◽  
Blocked Impurity Band Detectors

Modeling of steady-state field distributions in blocked impurity band detectors

2000 ◽  
Vol 77 (26) ◽  
pp. 4389-4391 ◽  
Author(s):  
N. M. Haegel ◽  
J. E. Jacobs ◽  
A. M. White
Keyword(s):  
Steady State ◽  
Impurity Band ◽  
Field Distributions ◽  
Blocked Impurity Band Detectors

Si:As blocked-impurity-band detectors for ISO's photometer

1995 ◽  
Author(s):  
Juergen Wolf ◽  
Lorenz Wiest ◽  
Ulrich Groezinger ◽  
Dietrich Lemke ◽  
Josef Schubert
Keyword(s):  
Impurity Band ◽  
Blocked Impurity Band Detectors
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