Modeling of steady-state field distributions in blocked impurity band detectors

2000 ◽  
Vol 77 (26) ◽  
pp. 4389-4391 ◽  
Author(s):  
N. M. Haegel ◽  
J. E. Jacobs ◽  
A. M. White
1973 ◽  
Vol 51 (19) ◽  
pp. 2114-2117
Author(s):  
K. O. Hill ◽  
C. K. Campbell

The integral equation is derived for the steady-state modal-field distributions in a circular plane-mirror laser interferometer containing a symmetrically positioned angular-limiting device. It is shown that this equation reduces to the corresponding Fox and Li formulation in the limit when the aperture is fully opened.


1992 ◽  
Vol 72 (1) ◽  
pp. 273-275 ◽  
Author(s):  
James E. Huffman ◽  
A. G. Crouse ◽  
B. L. Halleck ◽  
T. V. Downes ◽  
Terry L. Herter

1997 ◽  
Vol 484 ◽  
Author(s):  
C. S. Olsen ◽  
J. W. Beeman ◽  
W. L. Hansen ◽  
E. E. Hallerab

AbstractWe report on the development of Germanium Blocked Impurity Band (BIB) photoconductors for long wavelength infrared detection in the 100 to 250.μm region. Liquid Phase Epitaxy (LPE) was used to grow the high purity blocking layer, and in some cases, the heavily doped infrared absorbing layer that comprise theses detectors. To achieve the stringent demands on purity and crystalline perfection we have developed a high purity LPE process which can be used for the growth of high purity as well as purely doped Ge epilayers. The low melting point, high purity metal, Pb, was used as a solvent. Pb has a negligible solubility <1017 cm−3 in Ge at 650°C and is isoelectronic with Ge. We have identified the residual impurities Bi, P, and Sb in the Ge epilayers and have determined that the Pb solvent is the source. Experiments are in progress to purify the Pb. The first tests of BIB structures with the purely doped absorbing layer grown on high purity substrates look very promising. The detectors exhibit extended wavelength cutoff when compared to standard Ge:Ga photoconductors (155 μm vs. 120 μm) and show the expected asymmetric current-voltage dependencies. We are currently optimizing doping and layer thickness to achieve the optimum responsivity, Noise Equivalent Power (NEP), and dark current in our devices.


2014 ◽  
Vol 105 (14) ◽  
pp. 143501 ◽  
Author(s):  
K. S. Liao ◽  
N. Li ◽  
C. Wang ◽  
L. Li ◽  
Y. L. Jing ◽  
...  

1995 ◽  
Author(s):  
Juergen Wolf ◽  
Lorenz Wiest ◽  
Ulrich Groezinger ◽  
Dietrich Lemke ◽  
Josef Schubert

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