Conductance fluctuations in free-standing hydrogenated amorphous silicon nanoparticles

2005 ◽  
Author(s):  
Thomas J. Belich ◽  
Zhe Shen ◽  
Charlie P. Blackwell ◽  
Stephen A. Campbell ◽  
James Kakalios
2021 ◽  
pp. 133140
Author(s):  
Feiyu Xu ◽  
Giorgio Nava ◽  
Prithwish Biswas ◽  
Isabelle Dulalia ◽  
Haiyang Wang ◽  
...  

1993 ◽  
Vol 47 (19) ◽  
pp. 12578-12589 ◽  
Author(s):  
C. E. Parman ◽  
N. E. Israeloff ◽  
J. Kakalios

2008 ◽  
Vol 1066 ◽  
Author(s):  
C. Blackwell ◽  
Xiaodong Pi ◽  
U. Kortshagen ◽  
J. Kakalios

ABSTRACTHydrogenated amorphous silicon films containing silicon nanocrystalline inclusions (a/nc-Si:H) that have been n-type doped have been synthesized using a dual-plasma co-deposition system. We report the structural and electronic properties of n-type doped a/nc-Si:H as a function of phosphine doping level and nanocrystalline concentration. The volume fraction of nanocrystals in the doped a/nc-Si:H thin films is measured using Raman spectroscopy, and the hydrogen binding configurations are characterized using infra-red absorption spectroscopy. In undoped a/nc-Si:H, the inclusion of low and moderate nanocrystalline concentrations results in an increase in the dark conductivity, compared to a-Si:H films grown without nanocrystalline inclusions. In contrast, the addition of even a low concentration of silicon nanoparticles in doped a/nc-Si:H thin films leads to a decrease in the dark conductivity and photoconductivity, compared to pure a-Si:H films.


2005 ◽  
Vol 20 (2) ◽  
pp. 277-281 ◽  
Author(s):  
J. Farjas ◽  
J. Serra-Miralles ◽  
P. Roura ◽  
E. Bertran ◽  
P. Roca i Cabarrocas

Thermal crystallization experiments carried out using calorimetry on several a-Si:H materials with different microstructures are reported. The samples were crystallized during heating ramps at constant heating rates up to 100 K/min. Under these conditions, crystallization takes place above 700 °C and progressively deviates from the standard kinetics. In particular, two crystallization processes were detected in conventional a-Si:H, which reveal an enhancement of the crystallization rate. At 100 K/min, such enhancement is consistent with a diminution of the crystallization time by a factor of 7. In contrast, no systematic variation of the resulting grain size was observed. Similar behavior was also detected in polymorphous silicon and silicon nanoparticles, thus showing that it is characteristic of a variety of hydrogenated amorphous silicon materials.


1992 ◽  
Vol 258 ◽  
Author(s):  
C. E. Parman ◽  
N. E. Israeloff ◽  
J. Kakalios

ABSTRACTStatistical analysis of the 1/f noise power spectrum of co-planar current fluctuations in n-type doped hydrogenated amorphous silicon (a-Si:H) find that the noise arises from a small number of correlated fluctuators. The noise power displays a complicated time dependence with the noise power changing in both magnitude and as a function of frequency. Spectral analysis of these noise power fluctuations display an approximate 1/f frequency dependence. These results are surprising given the effective volume (∼10-7 cm3) of the sample, and indicate that cooperative dynamics govern conductance fluctuations in a-Si:H.


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