Investigating the differences in low-frequency noise behavior of npn and pnp SiGe HBTs fabricated in a complementary SiGe HBT BiCMOS on SOI technology
2000 ◽
Vol 47
(5)
◽
pp. 1107-1112
◽
Keyword(s):
2003 ◽
Vol 43
(2)
◽
pp. 243-248
◽
Modeling and characterization of SiGe HBT low-frequency noise figures-of-merit for RFIC applications
2002 ◽
Vol 50
(11)
◽
pp. 2467-2473
◽
HEMTs for low-power and low-frequency noise 4.2 K cryoelectronics : fabrication and characterization
1998 ◽
Vol 08
(PR3)
◽
pp. Pr3-131-Pr3-134
◽
Keyword(s):
Keyword(s):