Temperature dependence and electrical properties of dominant low-frequency noise source in SiGe HBT

2000 ◽  
Vol 47 (5) ◽  
pp. 1107-1112 ◽  
Author(s):  
S. Bruce ◽  
K.J. Vandamme ◽  
A. Rydberg
2005 ◽  
Author(s):  
Enhai Zhao ◽  
Ramkumar Krithivasan ◽  
Akil K. Sutton ◽  
Zhenrong Jin ◽  
John D. Cressler ◽  
...  

Author(s):  
Yang Song ◽  
Jian Kang

Existing approaches to reducing the low-frequency noise exposure of dwellings are not always sufficient. This study investigated the significance of dwelling layout design for low-frequency noise control. The sound distribution in six typical Chinese dwelling layouts was analysed using in-situ measurements under steady-state noise of various low frequencies. The results showed that among two-bedroom dwelling layouts, the overall average noise reduction varied considerably (6 dB). The noise reduction for room levels (number of rooms sound crosses) 1–2 and 2–3 varies by 5 and 3 dB, respectively, and the noise reduction at door openings varies by 5 dB. A model to approximate the low-frequency noise reduction of a layout was developed using the polyline distance from the noise source and the number of walls the polyline has to cross, which were clearly shown to influence low-frequency noise reduction and seem to be the strongest investigated factors.


2000 ◽  
Vol 14 (07) ◽  
pp. 751-760 ◽  
Author(s):  
F. V. GASPARYAN ◽  
S. V. MELKONYAN ◽  
V. M. AROUTIOUNYAN ◽  
H. V. ASRIYAN

The low-frequency noise spectral density with the 1/f spectrum for homopolar and heteropolar semi-conductors is theoretically obtained taking into account conduction electron–optical phonon interactions. The analytical expressions of the spectral density and Hooge's α H parameter are presented. The analytical temperature dependence of Hooge's parameter is compared with experimental data for n-Si and n-GaAs.


1998 ◽  
Vol 12 (29n30) ◽  
pp. 1245-1254 ◽  
Author(s):  
S. V. Melkonyan ◽  
F. V. Gasparyan ◽  
V. M. Aroutiouyan ◽  
H. V. Asriyan

The influence of the electron–phonon interaction on formation of the low-frequency noise in semiconductors is theoretically considered. The determining role of scattering mechanisms in formation of the 1/f low frequency noise is shown. The temperature dependence of the Hooge parameter αH is revealed and explained. The lattice character of αH is proven.


Author(s):  
T. Nakashio ◽  
K. Higaki ◽  
I. Oshita

The propagation of low frequency noise from a shake-out machine has been investigated. It was shown that the primary noise source was in the rotation of the imbalanced mass and noise reduction was achieved by reducing the rotational speed.


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