Observation and control of thin-film defects using in-situ total-internal-reflection microscopy
1992 ◽
Vol 10
(4)
◽
pp. 1472-1478
◽
2018 ◽
Vol 122
(30)
◽
pp. 17552-17558
◽
2006 ◽
Vol 90
(12)
◽
pp. 4662-4671
◽
2013 ◽
Vol 429
◽
pp. 74-81
◽
2006 ◽
Vol 291
(1)
◽
pp. G146-G155
◽
2018 ◽
Vol 266
◽
pp. 561-569
◽