A scattered-light-based system for the probe beam monitoring of laser ablation dynamic

2004 ◽  
Author(s):  
Hanriete P. de Souza ◽  
Egberto Munin ◽  
Leandro P. Alves ◽  
Marcela L. Redigolo ◽  
Marcos Tadeu T. Pacheco
2011 ◽  
Vol 4 (4) ◽  
pp. 4165-4208
Author(s):  
F. Gaie-Levrel ◽  
S. Perrier ◽  
E. Perraudin ◽  
C. Stoll ◽  
N. Grand ◽  
...  

Abstract. A single particle instrument has been developed for real-time analysis of organic aerosols. This instrument, named Single Particle Laser Ablation Mass Spectrometry (SPLAM), samples particles using an aerodynamic lens system for which the theoretical performances were calculated. At the outlet of this system, particle detection and sizing are realized using two continuous diode lasers operating at λ = 403 nm. Polystyrene Latex (PSL), sodium chloride (NaCl) and dioctylphtalate (DOP) particles were used to characterize and calibrate optical detection of SPLAM. The optical detection limit (DL) and detection efficiency (DE) were determined using size-selected DOP particles. The DE is ranging from 0.1 to 90 % for 100 and 350 nm DOP particles respectively and the SPLAM instrument is able to detect and size-resolve particles as small as 110–120 nm. Scattered light is detected by two photomultipliers and the detected signals are used to trigger a UV excimer laser (λ = 248 nm) used for laser desorption ionization (LDI) of individual aerosol particles. The formed ions are analyzed by a 1 m linear time-of-flight mass spectrometer in order to access to the chemical composition of individual particles. The TOF-MS detection limit for gaseous aromatic compounds was determined to be 0.85 attograms. DOP particles were also used to test the overall functioning of the instrument. The analysis of a secondary organic aerosol, formed in a smog chamber by the ozonolysis of indene, is presented as a first scientific application of the instrument. Single particle mass spectra are obtained with a global hit rate of 10 %. They are found to be very different from one particle to another, reflecting chemical differences of the analyzed particles, and most of the detected mass peaks are attributed to oxidized products of indene.


2005 ◽  
Vol 2 (4) ◽  
pp. 198-203 ◽  
Author(s):  
A Kaemling ◽  
A Hermann ◽  
F Ach ◽  
C Fischer ◽  
W Viöl

1998 ◽  
Vol 526 ◽  
Author(s):  
D. B. Geohegan ◽  
A. A. Puretzky ◽  
G. Duscher ◽  
S. J. Pennycook

AbstractThe dynamics of gas phase nanoparticle formation by pulsed laser ablation into background gases are revealed by imaging photoluminescence and Rayleigh-scattered light from gas-suspended SiOx nanoparticles following ablation of c-Si targets into 1-10 Torr He and Ar. Two sets of dynamic phenomena are presented for times up to 15 s after KrF-laser ablation. Ablation of Si into heavier Ar results in a uniform, stationary plume of nanoparticles while Si ablation into lighter He results in a turbulent ring of particles which propagates forward at 10 m/s. The effects of gas flow on nanoparticle formation, photoluminescence, and collection are described. The first in situ time-resolved photoluminescence spectra from 1-10 nm diameter silicon particles were measured as the nanoparticles were formed and transported. Three spectral bands (1.8, 2.5 and 3.2 eV) similar to photoluminescence from oxidized porous silicon were measured, but with a pronounced vibronic structure. The size and composition of individual gas-condensed nanoparticles were determined by scanning transmission electron microscopy and correlated with the gas-phase photoluminescence. Weblike-aggregate nanoparticle films were collected at room temperature and 77K on c-Si substrates. After standard passivation anneals, the films exhibited strong room temperature photo-luminescence consisting of 3 spectral bands in agreement with the gas-phase measurements, however lacking the vibronic structure. These techniques demonstrate new ways to study and optimize the luminescence of novel optoelectronic nanomaterials during synthesis in the gas phase, prior to deposition.


2005 ◽  
Vol 2 (9) ◽  
pp. 459-464 ◽  
Author(s):  
A Hermann ◽  
A Kaemling ◽  
F Ach ◽  
C Fischer ◽  
W Viöl

Author(s):  
M. Grant Norton ◽  
C. Barry Carter

Pulsed-laser ablation has been widely used to produce high-quality thin films of YBa2Cu3O7-δ on a range of substrate materials. The nonequilibrium nature of the process allows congruent deposition of oxides with complex stoichiometrics. In the high power density regime produced by the UV excimer lasers the ablated species includes a mixture of neutral atoms, molecules and ions. All these species play an important role in thin-film deposition. However, changes in the deposition parameters have been shown to affect the microstructure of thin YBa2Cu3O7-δ films. The formation of metastable configurations is possible because at the low substrate temperatures used, only shortrange rearrangement on the substrate surface can occur. The parameters associated directly with the laser ablation process, those determining the nature of the process, e g. thermal or nonthermal volatilization, have been classified as ‘primary parameters'. Other parameters may also affect the microstructure of the thin film. In this paper, the effects of these ‘secondary parameters' on the microstructure of YBa2Cu3O7-δ films will be discussed. Examples of 'secondary parameters' include the substrate temperature and the oxygen partial pressure during deposition.


2007 ◽  
Vol 177 (4S) ◽  
pp. 52-52
Author(s):  
Joshua M. Stem ◽  
Jer-Tsang Hsieh ◽  
Sangtae Park ◽  
Yair Lotan ◽  
Jeffrey A. Cadeddu

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