Online laser beam monitoring by detection of scattered light from dielectric mirrors

2005 ◽  
Vol 2 (4) ◽  
pp. 198-203 ◽  
Author(s):  
A Kaemling ◽  
A Hermann ◽  
F Ach ◽  
C Fischer ◽  
W Viöl
Keyword(s):  
Laser Beam ◽  
Scattered Light ◽  
Dielectric Mirrors ◽  
Beam Monitoring

Utilisation of scattered light for excimer laser beam monitoring

2005 ◽  
Vol 2 (9) ◽  
pp. 459-464 ◽  
Author(s):  
A Hermann ◽  
A Kaemling ◽  
F Ach ◽  
C Fischer ◽  
W Viöl
Keyword(s):  
Laser Beam ◽  
Excimer Laser ◽  
Scattered Light ◽  
Beam Monitoring

A scattered-light-based system for the probe beam monitoring of laser ablation dynamic

2004 ◽  
Author(s):  
Hanriete P. de Souza ◽  
Egberto Munin ◽  
Leandro P. Alves ◽  
Marcela L. Redigolo ◽  
Marcos Tadeu T. Pacheco
Keyword(s):  
Laser Ablation ◽  
Probe Beam ◽  
Scattered Light ◽  
Beam Monitoring

Raman Apparatus Using Laser Excitation and Polarization Measurements. Rotational Spectrum of Fluorine

1969 ◽  
Vol 23 (1) ◽  
pp. 8-12 ◽  
Author(s):  
Howard H. Claassen ◽  
Henry Selig ◽  
Jacob Shamir
Keyword(s):  
Laser Beam ◽  
Raman Spectra ◽  
Laser Excitation ◽  
Scattered Light ◽  
Rotational Constant ◽  
Emission Lines ◽  
Optical Systems ◽  
Rotational Spectrum ◽  
Polarization Measurements

Various schemes are compared for measuring depolarization factors in Raman spectra with laser excitation. Optical systems are discussed for producing a laser beam free of unwanted emission lines and for focusing scattered light on the slit and on the detector. The rotational spectrum of gaseous F2 has been used to determine a rotational constant of Bo=0.8841 ±0.0006 cm−1, corresponding to r0=1.4168±0.0005 Å.

scholarly journals A simple and highly sensitive spectroscopic fluorescence-detection system for multi-channel plastic-microchip electrophoresis based on side-entry laser-beam zigzag irradiation

Lab on a Chip ◽  
2017 ◽  
Vol 17 (13) ◽  
pp. 2235-2242 ◽  
Author(s):  
Takashi Anazawa ◽  
Yuichi Uchiho ◽  
Takahide Yokoi ◽  
George Chalkidis ◽  
Motohiro Yamazaki
Keyword(s):  
Laser Beam ◽  
Fluorescence Detection ◽  
Detection System ◽  
Scattered Light ◽  
Microchip Electrophoresis ◽  
Highly Sensitive ◽  
Fluorescence Detection System

Fluorescence from eight A channels and Raman-scattered light from seven B channels, induced by a side-entry laser beam, were simultaneously, uniformly, and spectroscopically detected.

Real-time measurement of laser beam quality factor (M2) by imaging transverse scattered light

2007 ◽  
Author(s):  
Kelly Cristina Jorge ◽  
Rudimar Riva ◽  
Nicolau Andre Silveira Rodrigues ◽  
Marcelo G. Destro
Keyword(s):  
Laser Beam ◽  
Quality Factor ◽  
Real Time ◽  
Beam Quality ◽  
Scattered Light ◽  
Time Measurement ◽  
Beam Quality Factor ◽  
Real Time Measurement ◽  
Laser Beam Quality

Research on 10.6 μm laser beam monitoring in CO 2 laser processing system

2007 ◽  
Author(s):  
Yali Shi ◽  
Yunguo Gao ◽  
Weijie Deng ◽  
Shuai Shao
Keyword(s):  
Laser Beam ◽  
Laser Processing ◽  
Processing System ◽  
Beam Monitoring

Scattered light imaging method (SLIM) for characterization of arbitrary laser beam intensity profiles

2014 ◽  
Vol 53 (20) ◽  
pp. 4555 ◽  
Author(s):  
Kelly C. Jorge ◽  
Rudimar Riva ◽  
Nicolau A. S. Rodrigues ◽  
João M. S. Sakamoto ◽  
Marcelo G. Destro
Keyword(s):  
Laser Beam ◽  
Scattered Light ◽  
Beam Intensity ◽  
Imaging Method ◽  
Laser Beam Intensity

scholarly journals Modeling an improved method for double modulation photo reflectance experiments

2004 ◽  
Vol 2 (01) ◽  
Author(s):  
M. Hernández ◽  
R. Ivanov
Keyword(s):  
Laser Beam ◽  
Relative Error ◽  
Switching Time ◽  
Scattered Light ◽  
Improved Method ◽  
Finite Resolution ◽  
Useful Signal ◽  
Electronic Filters ◽  
Pin Photodiodes ◽  
Double Modulation

This paper describes an improved method to be used in double modulation photo reflectance experiments, in order to reduce the influence of parasitic effects in the useful signal. The method uses the inner and outer sections of a single chopper disk to modulate the monochromator and the laser beam, eliminating the need of complex electronic filters, and two additional PIN photodiodes for scattered light compensation. The method has been numerically simulated using LabVIEW in order to investigate the influence of the modulator finite switching time and the finite resolution of the digital acquisition system. Results show that a relative error less than 1% can be achieved.

A Device for Surface-Scanning Micro-Raman Spectroscopy

1992 ◽  
Vol 46 (9) ◽  
pp. 1331-1334 ◽  
Author(s):  
M. Lankers ◽  
D. Göttges ◽  
A. Materny ◽  
K. Schaschek ◽  
W. Kiefer
Keyword(s):  
Raman Spectroscopy ◽  
Laser Beam ◽  
Low Temperatures ◽  
Scattered Light ◽  
Solid Samples ◽  
Surface Scanning ◽  
Micro Raman Spectroscopy ◽  
Small Spot ◽  
Computer Controlled ◽  
Rapid Scanning

A simple but very efficient device for micro-Raman spectroscopy of highly absorbing solid samples is described. The device allows rapid scanning of the focused laser beam on the surface of a solid sample, which avoids heating of the sample. By means of a pair of computer-controlled piezo-translators, which are fixed to the microscope objective, the laser beam can be scanned in a great variety of traces, the scattered light of which is collected and optically transformed into a very small spot at the entrance slit of the spectrometer. The system is tested on highly absorbing (partially) polymerized diacetylene single crystals at low temperatures.

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