scholarly journals Surface damage growth mitigation on KDP/DKDP optics using single-crystal diamond micromachining

2004 ◽  
Author(s):  
Lawrence W. Hrubesh ◽  
John J. Adams ◽  
Michael D. Feit ◽  
Walter D. Sell ◽  
Joel A. Stanley ◽  
...  
Keyword(s):  
Single Crystal ◽  
Surface Damage ◽  
Damage Growth ◽  
Single Crystal Diamond

Surface damage of single-crystal diamond (100) processed based on a sol-gel polishing tool

2018 ◽  
Vol 83 ◽  
pp. 46-53 ◽  
Author(s):  
Yingchao Lin ◽  
Jing Lu ◽  
Ruilong Tong ◽  
Qiufa Luo ◽  
Xipeng Xu
Keyword(s):  
Single Crystal ◽  
Sol Gel ◽  
Surface Damage ◽  
Single Crystal Diamond ◽  
Polishing Tool

Deep UV Photodetectors fabricated from CVD Single Crystal Diamond

2009 ◽  
Vol 1203 ◽  
Author(s):  
Mose Bevilacqua ◽  
Richard B. Jackman
Keyword(s):  
Single Crystal ◽  
Surface Damage ◽  
High Quality ◽  
Uv Photodetectors ◽  
Single Crystal Diamond ◽  
Defect Passivation ◽  
Deep Uv ◽  
Passivation Treatment ◽  
Homoepitaxial Layers ◽  
The Impact

AbstractDeep UV detection using a single crystal diamond (SCD) substrate without a homoepitaxial layer has been demonstrated using a defect passivation treatment. Despite evidence of surface damage on the SCD, the treatments lead to highly effective photoconductive devices, displaying six-orders of discrimination between deep UV and visible light and a responsivity as high as 100A/W, equivalent to an external quantum efficiency of 700, similar to the best values for devices based on high quality homoepitaxial layers. Impedance spectroscopic investigations suggest that the treatment used reduces the impact of less resistive surface material, most likely defects left from substrate polishing.

Fast removal of surface damage layer from single crystal diamond by using chemical etching in molten KCl + KOH solution

2016 ◽  
Vol 63 ◽  
pp. 86-90 ◽  
Author(s):  
Y. Yao ◽  
Y. Ishikawa ◽  
Y. Sugawara ◽  
H. Yamada ◽  
A. Chayahara ◽  
...  
Keyword(s):  
Single Crystal ◽  
Chemical Etching ◽  
Surface Damage ◽  
Damage Layer ◽  
Single Crystal Diamond ◽  
Fast Removal

scholarly journals Epitaxial lateral growth of single-crystal diamond under high pressure by a plate-to-plate MPCVD

2021 ◽  
Vol 1 (1) ◽  
pp. 143-149
Author(s):  
Wei Cao ◽  
Deng Gao ◽  
Hongyang Zhao ◽  
Zhibin Ma
Keyword(s):  
High Pressure ◽  
Single Crystal ◽  
Lateral Growth ◽  
Single Crystal Diamond

On The Optimized Nucleation of Near-Single-Crystal Cvd Diamond Film

1995 ◽  
Vol 416 ◽  
Author(s):  
L. C. Chen ◽  
C. C. Juan ◽  
J. Y. Wu ◽  
K. H. Chen ◽  
J. W. Teng
Keyword(s):  
Single Crystal ◽  
Photoelectron Spectroscopy ◽  
Morphological Evolution ◽  
Present Report ◽  
Ex Situ ◽  
Nucleation Density ◽  
Induced Current ◽  
Current Time ◽  
Single Crystal Diamond

ABSTRACTNear-single-crystal diamond films have been obtained in a number of laboratories recently. The optimization of nucleation density by using a bias-enhanced nucleation (BEN) method is believed to be a critical step. However, the condition of optimized nucleation has never been clearly delineated. In the present report, a novel quantitative technique was established to monitor the nucleation of diamond in-situ. Specifically, the induced current was measured as a function of nucleation time during BEN. The timedependence of induced current was studied under various methane concentrations as well as substrate temperatures. The optimized nucleation condition can be unambiguously determined from the current-time plot. Besides the in-situ current probe, ex-situ x-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) were also used to investigate the chemical and morphological evolution. Characteristic XPS and AFM features of optimized nucleation is discussed.

Development of Diamond-Based X-ray Detection for High Flux Beamline Diagnostics

2009 ◽  
Vol 1203 ◽  
Author(s):  
Jen Bohon ◽  
John Smedley ◽  
Erik M. Muller ◽  
Jeffrey W. Keister
Keyword(s):  
Single Crystal ◽  
Linear Response ◽  
Voltage Dependence ◽  
Cvd Diamond ◽  
High Flux ◽  
National Synchrotron Light Source ◽  
X Ray ◽  
Single Crystal Diamond ◽  
Synchrotron Light ◽  
Pulse Structure

AbstractHigh quality single crystal and polycrystalline CVD diamond detectors with platinum contacts have been tested at the white beam X28C beamline at the National Synchrotron Light Source under high-flux conditions. The voltage dependence of these devices has been measured under DC and pulsed-bias conditions, establishing the presence or absence of photoconductive gain in each device. Linear response has been achieved over eleven orders of magnitude when combined with previous low flux studies. Temporal measurements with single crystal diamond detectors have resolved the ns scale pulse structure of the NSLS.

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