New method of vibration isolation of scanning electron microscope

2004 ◽  
Author(s):  
Koichi Matsuda ◽  
Yoichi Kanemitsu ◽  
Shinya Kijimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Vibration Isolation ◽  
New Method ◽  
Scanning Electron

The Nano Membrane-Like Structure of the Precambrian Microfossils under Atomic Force Microscope (AFM)

2007 ◽  
Vol 121-123 ◽  
pp. 739-742 ◽  
Author(s):  
H.M. Chi ◽  
Z.D. Xiao ◽  
Xin Xing Xiao
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Atomic Force Microscope ◽  
Early Life ◽  
Three Dimensional ◽  
New Method ◽  
Subcellular Structure ◽  
Atomic Force ◽  
Fossil Embryos ◽  
Scanning Electron

Weng`an fauna in Guizhou, China provides a unique window for the evolution of the early life especially since the animal embryos and sponge is found there. Phosphatization makes the fossils preserve in details including cells and subcellular structure. Here we use atomic force microscope observing the surface of some three dimensional preserved embryo fossils and the ultra membrane-like structure is found under atomic force microscope (AFM) while such structure can`t be found under scanning electron microscope (SEM). The membrane-like structure is approximately 10nm in thickness which maybe one part of the fossil embryos or belong to another nano scale microfossils. Therefore, AFM provides a new method for the study of the ultra structure of the microfossils from Weng`an fauna.

Study on a New Method to Produce NiTi Thin Film

2011 ◽  
Vol 415-417 ◽  
pp. 1899-1902
Author(s):  
Yi Guo Zhu ◽  
Wen Mao
Keyword(s):  
Thin Film ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Layer Structure ◽  
Great Influence ◽  
Film Structure ◽  
New Method ◽  
Technological Parameters ◽  
Sputtering Power ◽  
Scanning Electron

A new method to prepare NiTi thin film with two separate targets is presented. In this technology, two pure Ni target and pure Ti target are fixed and the substrate is rotating. The final thin film structure is analyzed by Scanning Electron Microscope. Results show that there is no layer structure in the film; the sputtering power and the substrate temperature have great influence to the morphology of the film; all the grain pattern are column under different technological parameters.

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