High-voltage atomic force microscopy: a new technology for nanoscale optical devices

2003 ◽  
Author(s):  
Yossi Rosenwaks ◽  
Michel Molotskii ◽  
Alex Agronin ◽  
Pavel Urenski ◽  
Gil Rosenman
Keyword(s):  
Atomic Force Microscopy ◽  
High Voltage ◽  
New Technology ◽  
Optical Devices ◽  
Force Microscopy ◽  
Atomic Force

Using Atomic Force Microscopy to Evaluate Microstructure for Direct Metal Laser Melted Titanium

2021 ◽  
Vol 324 ◽  
pp. 26-34
Author(s):  
Grant Wong ◽  
Chris Sharp
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
New Technology ◽  
Average Surface Roughness ◽  
Average Surface ◽  
Force Microscopy ◽  
Industrial Manufacturing ◽  
Atomic Force ◽  
Fast Cooling ◽  
Pore Depth

Additive Manufacturing (AM) is a relatively new technology that could potentially revolutionize industrial manufacturing. Currently, papers have studied the mechanical properties and microstructure of AM materials without the use of Atomic Force Microscopy (AFM). This paper utilizes AFM to analyze the Widmanstätten microstructure and porosity of Direct Metal Laser Melted (DMLM) titanium samples. The mechanical properties of the titanium samples were collected, and the samples exhibited favorable yield and tensile strengths, but suboptimal ductile properties. The DMLM titanium seemed to have an increase in yield and tensile strength while the ductility seemed to decrease as a result of the fast cooling rate utilized in the DMLM process. AFM was used when analyzing the Widmanstätten microstructure which had an average surface roughness of 142 nm and the pore depth of one sample was 3.3 μm. The substantial depth of the pores could potentially be related to the decrease in ductility and it could increase the potential of future premature fractures. AFM provided a lot of useful information for this study and could provide even more information within the metallurgical field when studying the microstructure and porosity of metals, especially for AM materials.

scholarly journals Separate-type scanner and wideband high-voltage amplifier for atomic-resolution and high-speed atomic force microscopy

2013 ◽  
Vol 84 (4) ◽  
pp. 043705 ◽  
Author(s):  
Kazuki Miyata ◽  
Satoshi Usho ◽  
Satoshi Yamada ◽  
Shoji Furuya ◽  
Kiyonori Yoshida ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Voltage ◽  
High Speed ◽  
Atomic Resolution ◽  
Force Microscopy ◽  
Separate Type ◽  
Atomic Force ◽  
Voltage Amplifier

scholarly journals Development of in-situ high-voltage and high-temperature stressing capability on atomic force microscopy platform

Solar Energy ◽  
2017 ◽  
Vol 158 ◽  
pp. 746-752 ◽  
Author(s):  
Chuanxiao Xiao ◽  
Chun-Sheng Jiang ◽  
Steve Johnston ◽  
Xiaowu Yang ◽  
Jichun Ye ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Temperature ◽  
High Voltage ◽  
Force Microscopy ◽  
Atomic Force
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