Modeling of micro- and nano-scale domain recording by high-voltage atomic force microscopy in ferroelectric semiconductors

Anna N. Morozovska; Eugene A. Eliseev

doi:10.1016/j.physb.2005.11.049

Modeling of micro- and nano-scale domain recording by high-voltage atomic force microscopy in ferroelectric semiconductors

Physica B Condensed Matter ◽

10.1016/j.physb.2005.11.049 ◽

2006 ◽

Vol 373 (1) ◽

pp. 54-63 ◽

Cited By ~ 8

Author(s):

Anna N. Morozovska ◽

Eugene A. Eliseev

Keyword(s):

Atomic Force Microscopy ◽

High Voltage ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force

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Determination of solid surface tension at the nano-scale using atomic force microscopy

Contact Angle, Wettability and Adhesion, Volume 4 ◽

10.1201/b12166-17 ◽

2006 ◽

pp. 249-276

Keyword(s):

Surface Tension ◽

Atomic Force Microscopy ◽

Solid Surface ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force ◽

Solid Surface Tension

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Nano-Scale Observations of Tattoo Pigments in Skin by Atomic Force Microscopy

Tattooed Skin and Health - Current Problems in Dermatology ◽

10.1159/000369187 ◽

2015 ◽

pp. 97-102

Author(s):

Colin A. Grant ◽

Peter C. Twigg ◽

Desmond J. Tobin

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force

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Nano-scale imaging of chromosomes and DNA by scanning near-field optical/atomic force microscopy

Ultramicroscopy ◽

10.1016/s0304-3991(03)00032-9 ◽

2003 ◽

Vol 97 (1-4) ◽

pp. 81-87 ◽

Cited By ~ 22

Author(s):

Tomoyuki Yoshino ◽

Shigeru Sugiyama ◽

Shoji Hagiwara ◽

Daisuke Fukushi ◽

Motoharu Shichiri ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Near Field ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force

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Nano scale defects in langmuir-blodgett film observed by atomic force microscopy

Synthetic Metals ◽

10.1016/0379-6779(93)90515-x ◽

1993 ◽

Vol 57 (1) ◽

pp. 3795-3800 ◽

Cited By ~ 5

Author(s):

J. Garnaes ◽

D.K. Schwartz ◽

R. Viswanathan ◽

J.A.N. Zasadzinski

Keyword(s):

Atomic Force Microscopy ◽

Blodgett Film ◽

Force Microscopy ◽

Langmuir Blodgett ◽

Nano Scale ◽

Atomic Force ◽

Langmuir Blodgett Film

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Piezoelectric Coefficient Measurements in Ferroelectric Single Crystals Using High Voltage Atomic Force Microscopy

Nano Letters ◽

10.1021/nl0258933 ◽

2003 ◽

Vol 3 (2) ◽

pp. 169-171 ◽

Cited By ~ 23

Author(s):

Alex G. Agronin ◽

Yossi Rosenwaks ◽

Gil I. Rosenman

Keyword(s):

Atomic Force Microscopy ◽

Single Crystals ◽

High Voltage ◽

Piezoelectric Coefficient ◽

Force Microscopy ◽

Atomic Force

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Atomic Force Microscopy Study of Yeast Cells Influenced by High Voltage Electrical Discharge

IFMBE Proceedings - 14th Nordic-Baltic Conference on Biomedical Engineering and Medical Physics ◽

10.1007/978-3-540-69367-3_160 ◽

2008 ◽

pp. 602-605

Author(s):

D. Borovikova ◽

S. Cifansky ◽

Y. Dekhtyar ◽

Veronika Fedotova ◽

V. Jakushevich ◽

...

Keyword(s):

Atomic Force Microscopy ◽

High Voltage ◽

Electrical Discharge ◽

Microscopy Study ◽

Yeast Cells ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force

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Wear characterisation of articular cartilage surfaces at a nano-scale using atomic force microscopy

Tribology International ◽

10.1016/j.triboint.2012.11.001 ◽

2013 ◽

Vol 63 ◽

pp. 235-242 ◽

Cited By ~ 9

Author(s):

M. Wang ◽

Z. Peng ◽

J. Wang ◽

X. Jiang

Keyword(s):

Atomic Force Microscopy ◽

Articular Cartilage ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force

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Nano-Scale Simulative Measuring Model for Tapping Mode Atomic Force Microscopy and Analysis for Measuring a Nano-Scale Ladder-Shape Standard Sample

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2010.2375 ◽

2010 ◽

Vol 10 (7) ◽

pp. 4400-4410

Author(s):

Zone-Ching Lin ◽

Ming-Ho Chou

Keyword(s):

Atomic Force Microscopy ◽

Standard Sample ◽

Tapping Mode ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Measurement of the roughness of nano-scale surfaces, both unannealed and with limited anneal, by atomic force microscopy

Measurement Science and Technology ◽

10.1088/0957-0233/25/10/105001 ◽

2014 ◽

Vol 25 (10) ◽

pp. 105001 ◽

Cited By ~ 2

Author(s):

M P Seah

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force

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The elastic modulus of articular cartilage at nano-scale and micro-scale measured using indentation type atomic force microscopy

Osteoarthritis and Cartilage ◽

10.1016/j.joca.2014.02.664 ◽

2014 ◽

Vol 22 ◽

pp. S359-S360 ◽

Cited By ~ 2

Author(s):

P. Rahnamay Moshtagh ◽

B. Pouran ◽

H. Weinans ◽

A. Zadpoor

Keyword(s):

Atomic Force Microscopy ◽

Elastic Modulus ◽

Articular Cartilage ◽

Force Microscopy ◽

Micro Scale ◽

Nano Scale ◽

Atomic Force

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