Ferroelectric domain reversal in LiNbO3 crystals using high-voltage atomic force microscopy

A. Agronin; Y. Rosenwaks; G. Rosenman

doi:10.1063/1.1772858

Ferroelectric domain reversal in LiNbO3 crystals using high-voltage atomic force microscopy

Applied Physics Letters ◽

10.1063/1.1772858 ◽

2004 ◽

Vol 85 (3) ◽

pp. 452-454 ◽

Cited By ~ 40

Author(s):

A. Agronin ◽

Y. Rosenwaks ◽

G. Rosenman

Keyword(s):

Atomic Force Microscopy ◽

High Voltage ◽

Ferroelectric Domain ◽

Force Microscopy ◽

Atomic Force ◽

Domain Reversal ◽

Ferroelectric Domain Reversal

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Piezoelectric Coefficient Measurements in Ferroelectric Single Crystals Using High Voltage Atomic Force Microscopy

Nano Letters ◽

10.1021/nl0258933 ◽

2003 ◽

Vol 3 (2) ◽

pp. 169-171 ◽

Cited By ~ 23

Author(s):

Alex G. Agronin ◽

Yossi Rosenwaks ◽

Gil I. Rosenman

Keyword(s):

Atomic Force Microscopy ◽

Single Crystals ◽

High Voltage ◽

Piezoelectric Coefficient ◽

Force Microscopy ◽

Atomic Force

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Atomic Force Microscopy Study of Yeast Cells Influenced by High Voltage Electrical Discharge

IFMBE Proceedings - 14th Nordic-Baltic Conference on Biomedical Engineering and Medical Physics ◽

10.1007/978-3-540-69367-3_160 ◽

2008 ◽

pp. 602-605

Author(s):

D. Borovikova ◽

S. Cifansky ◽

Y. Dekhtyar ◽

Veronika Fedotova ◽

V. Jakushevich ◽

...

Keyword(s):

Atomic Force Microscopy ◽

High Voltage ◽

Electrical Discharge ◽

Microscopy Study ◽

Yeast Cells ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force

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Ferroelectric domain engineering using atomic force microscopy tip arrays in the domain breakdown regime

Applied Physics Letters ◽

10.1063/1.1847711 ◽

2005 ◽

Vol 86 (1) ◽

pp. 012909 ◽

Cited By ~ 24

Author(s):

Y. Rosenwaks ◽

D. Dahan ◽

M. Molotskii ◽

G. Rosenman

Keyword(s):

Atomic Force Microscopy ◽

Ferroelectric Domain ◽

Domain Engineering ◽

Force Microscopy ◽

Atomic Force

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Nanodomain Engineering in Ferroelectric Crystals Using High Voltage Atomic Force Microscopy

Nanoscale Characterisation of Ferroelectric Materials - NanoScience and Technology ◽

10.1007/978-3-662-08901-9_8 ◽

2004 ◽

pp. 221-265 ◽

Cited By ~ 5

Author(s):

Y. Rosenwaks ◽

M. Molotskii ◽

A. Agronin ◽

P. Urenski ◽

M. Shvebelman ◽

...

Keyword(s):

Atomic Force Microscopy ◽

High Voltage ◽

Force Microscopy ◽

Ferroelectric Crystals ◽

Atomic Force

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3P292 Wideband operation of high-voltage amplifier for high-speed atomic force microscopy(26. Measurements,Poster,The 52nd Annual Meeting of the Biophysical Society of Japan(BSJ2014))

Seibutsu Butsuri ◽

10.2142/biophys.54.s297_4 ◽

2014 ◽

Vol 54 (supplement1-2) ◽

pp. S297

Author(s):

Hiroyuki Handa ◽

Daisuke Yamamoto

Keyword(s):

Atomic Force Microscopy ◽

Annual Meeting ◽

High Voltage ◽

High Speed ◽

Force Microscopy ◽

Atomic Force ◽

Voltage Amplifier ◽

Biophysical Society

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High-voltage atomic force microscopy: a new technology for nanoscale optical devices

10.1117/12.498327 ◽

2003 ◽

Cited By ~ 1

Author(s):

Yossi Rosenwaks ◽

Michel Molotskii ◽

Alex Agronin ◽

Pavel Urenski ◽

Gil Rosenman

Keyword(s):

Atomic Force Microscopy ◽

High Voltage ◽

New Technology ◽

Optical Devices ◽

Force Microscopy ◽

Atomic Force

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Increase of the roughness of the stainless-steel anode surface due to the exposure to high-voltage electric pulses as revealed by atomic force microscopy

Bioelectrochemistry ◽

10.1016/j.bioelechem.2006.12.003 ◽

2007 ◽

Vol 70 (2) ◽

pp. 519-523 ◽

Cited By ~ 22

Author(s):

Gintautas Saulis ◽

Raminta Rodaitė-Riševičienė ◽

Valentinas Snitka

Keyword(s):

Atomic Force Microscopy ◽

Stainless Steel ◽

High Voltage ◽

Anode Surface ◽

Electric Pulses ◽

Force Microscopy ◽

Atomic Force

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Modeling of micro- and nano-scale domain recording by high-voltage atomic force microscopy in ferroelectric semiconductors

Physica B Condensed Matter ◽

10.1016/j.physb.2005.11.049 ◽

2006 ◽

Vol 373 (1) ◽

pp. 54-63 ◽

Cited By ~ 8

Author(s):

Anna N. Morozovska ◽

Eugene A. Eliseev

Keyword(s):

Atomic Force Microscopy ◽

High Voltage ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force

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Modeling of ferroelectric domain imaging by atomic force microscopy

Journal of Applied Physics ◽

10.1063/1.3481409 ◽

2010 ◽

Vol 108 (6) ◽

pp. 064102 ◽

Cited By ~ 1

Author(s):

Manas Kumar Roy ◽

Jaita Paul ◽

Sushanta Dattagupta

Keyword(s):

Atomic Force Microscopy ◽

Ferroelectric Domain ◽

Force Microscopy ◽

Atomic Force

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Three-dimensional ferroelectric domain imaging of bulk Pb(Zr,Ti)O3 by atomic force microscopy

Applied Physics Letters ◽

10.1063/1.1655695 ◽

2004 ◽

Vol 84 (13) ◽

pp. 2382-2384 ◽

Cited By ~ 28

Author(s):

Seungbum Hong ◽

Bastien Ecabart ◽

Enrico L. Colla ◽

Nava Setter

Keyword(s):

Atomic Force Microscopy ◽

Three Dimensional ◽

Ferroelectric Domain ◽

Force Microscopy ◽

Atomic Force

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