In-plane displacement measurement using ESPI based on spatial fringe analysis method

Mapping Intimacies ◽

10.1117/12.473555 ◽

2002 ◽

Author(s):

Yasuhiko Arai ◽

Shunsuke Yokozeki

Keyword(s):

Displacement Measurement ◽

Analysis Method ◽

Fringe Analysis ◽

Plane Displacement

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In-plane displacement measurement using electronic-speckle-pattern-interferometry-based on spatial fringe analysis method

Optical Engineering ◽

10.1117/1.1778731 ◽

2004 ◽

Vol 43 (9) ◽

pp. 2168 ◽

Cited By ~ 32

Author(s):

Shunsuke Yokozeki

Keyword(s):

Speckle Pattern ◽

Displacement Measurement ◽

Electronic Speckle Pattern Interferometry ◽

Analysis Method ◽

Fringe Analysis ◽

Plane Displacement

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An out-of-plane displacement measurement system based on hardware tracking

10.1117/12.2266760 ◽

2017 ◽

Cited By ~ 1

Author(s):

Chen Xiong ◽

Ming Zhang ◽

Wenxin Hu ◽

Hong Miao

Keyword(s):

Measurement System ◽

Displacement Measurement ◽

Out Of Plane ◽

Plane Displacement

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In-plane displacement measurement configuration with twofold sensitivity

Applied Optics ◽

10.1364/ao.32.006387 ◽

1993 ◽

Vol 32 (31) ◽

pp. 6387 ◽

Cited By ~ 12

Author(s):

R. S. Sirohi ◽

N. Krishna Mohan

Keyword(s):

Displacement Measurement ◽

Plane Displacement

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Phase-stepping holographic moiré: simultaneous in-plane and out-of-plane displacement measurement

Applied Optics ◽

10.1364/ao.31.002405 ◽

1992 ◽

Vol 31 (14) ◽

pp. 2405 ◽

Cited By ~ 4

Author(s):

Eli Simova Simova ◽

Krassimir Nedialkov Stoev

Keyword(s):

Displacement Measurement ◽

Phase Stepping ◽

Out Of Plane ◽

Plane Displacement

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Out of plane displacement measurement based on electronic speckle pattern interferometry

2012 International Conference on Computer Science and Information Processing (CSIP) ◽

10.1109/csip.2012.6309106 ◽

2012 ◽

Author(s):

Fei Guo ◽

Maiyu Zhou ◽

Mei Zhao ◽

Yufang Sha ◽

Peng Li

Keyword(s):

Speckle Pattern ◽

Displacement Measurement ◽

Electronic Speckle Pattern Interferometry ◽

Out Of Plane ◽

Plane Displacement

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Orthogonal projection technique for resolution enhancement of the Fourier transform fringe analysis method

Optics Communications ◽

10.1016/j.optcom.2006.05.020 ◽

2006 ◽

Vol 266 (2) ◽

pp. 465-468 ◽

Cited By ~ 15

Author(s):

Paulo J. Tavares ◽

Mário A. Vaz

Keyword(s):

Fourier Transform ◽

Orthogonal Projection ◽

Resolution Enhancement ◽

Analysis Method ◽

Projection Technique ◽

Fringe Analysis ◽

The Fourier Transform

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Electric speckle pattern interferometry based on spatial fringe analysis method using multicamera

10.1117/12.695287 ◽

2006 ◽

Cited By ~ 2

Author(s):

Yasuhiko Arai ◽

Shunsuke Yokozeki

Keyword(s):

Speckle Pattern ◽

Analysis Method ◽

Fringe Analysis

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In-plane displacement measurement with sub-pixel resolution: application to vibration characterization of a shear-force scanning probe

10.1117/12.727070 ◽

2007 ◽

Cited By ~ 1

Author(s):

Patrick Sandoz ◽

Jean-Michel Friedt ◽

Émile Carry

Keyword(s):

Shear Force ◽

Displacement Measurement ◽

Scanning Probe ◽

Pixel Resolution ◽

Plane Displacement

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2-DOF in-Plane Displacement Measurement by Wollaston Prism-based Interferometer

2018 14th IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications (MESA) ◽

10.1109/mesa.2018.8449196 ◽

2018 ◽

Author(s):

Hung-Lin Hsieh ◽

Ju-Yi Lee ◽

Bo-Yen Sun ◽

Gang-Yu Fan

Keyword(s):

Displacement Measurement ◽

Wollaston Prism ◽

Plane Displacement

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Parametric Study of the Reflective Periodic Grating for In-Plane Displacement Measurement Using Optical Fibers

Sensors ◽

10.3390/s120404265 ◽

2012 ◽

Vol 12 (4) ◽

pp. 4265-4280 ◽

Cited By ~ 1

Author(s):

Yeon-Gwan Lee ◽

Dae-Hyun Kim ◽

Chun-Gon Kim

Keyword(s):

Optical Fibers ◽

Parametric Study ◽

Displacement Measurement ◽

Periodic Grating ◽

Plane Displacement

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