Development of plasma chemical vaporization machining and elastic emission machining systems for coherent x-ray optics

Author(s):  
Yuzo Mori ◽  
Y. Yamauchi ◽  
Kazuya Yamamura ◽  
Hidekazu Mimura ◽  
A. Saito ◽  
...  
2019 ◽  
Vol 26 (2) ◽  
pp. 333-338 ◽  
Author(s):  
Tetsuo Katayama ◽  
Takashi Hirano ◽  
Yuki Morioka ◽  
Yasuhisa Sano ◽  
Taito Osaka ◽  
...  

X-ray optics were implemented for advanced ultrafast X-ray experiments with different techniques at the hard X-ray beamline BL3 of SPring-8 Ångstrom Compact free-electron LAser. A double channel-cut crystal monochromator (DCCM) and compound refractive lenses (CRLs) were installed to tailor the beam conditions. These X-ray optics can work simultaneously with an arrival-timing monitor that compensates for timing jitter and drift. Inner-walls of channel-cut crystals (CCs) in the DCCM were processed by plasma chemical vaporization machining to remove crystallographic damage. Four-bounced reflection profiles of the CCs were investigated and excellent diffraction qualities were achieved. The use of CRLs enabled two-dimensional X-ray focusing with a spot size of ∼1.5 µm × 1.5 µm full width at half-maximum, while keeping reasonable throughputs for a wide photon energy range of 5−15 keV.


Author(s):  
G.E. Ice

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.


2015 ◽  
Vol 185 (11) ◽  
pp. 1203-1214 ◽  
Author(s):  
Aleksandr S. Pirozhkov ◽  
Evgenii N. Ragozin

2019 ◽  
Vol 190 (01) ◽  
pp. 74-91
Author(s):  
Nikolai I. Chkhalo ◽  
Ilya V. Malyshev ◽  
Alexey E. Pestov ◽  
Vladimir N. Polkovnikov ◽  
Nikolai N. Salashchenko ◽  
...  
Keyword(s):  

2021 ◽  
Vol 92 (6) ◽  
pp. 063506
Author(s):  
N. R. Pereira ◽  
A. T. Macrander ◽  
E. Kasman ◽  
X.-R. Huang ◽  
E. O. Baronova

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