Defect formation/relaxation processes in Ge-doped SiO 2 by ArF laser irradiation
2003 ◽
Vol 216-217
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pp. 41-46
1979 ◽
Vol 10
(4)
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pp. 359-364
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2008 ◽
Vol 163
(11)
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pp. 863-871
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Keyword(s):
2005 ◽
Vol 109
(48)
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pp. 10897-10902
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