Numerical comparison between shear force, constant height, and constant intensity images in scanning near-field optical microscopy

Mapping Intimacies ◽

10.1117/12.363854 ◽

1999 ◽

Author(s):

Mufei Xiao ◽

Xin Chen

Keyword(s):

Optical Microscopy ◽

Force Constant ◽

Shear Force ◽

Near Field ◽

Numerical Comparison ◽

Constant Intensity ◽

Constant Height ◽

Intensity Images

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Numerical comparison between constant-height and constant-intensity images in scanning near field optical microscopy

Optics Communications ◽

10.1016/s0030-4018(99)00338-7 ◽

1999 ◽

Vol 168 (1-4) ◽

pp. 25-34 ◽

Cited By ~ 1

Author(s):

Mufei Xiao ◽

Xin Chen

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Numerical Comparison ◽

Constant Intensity ◽

Constant Height ◽

Intensity Images

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Shear-force, constant-height, and constant-intensity imaging in scanning near-field optical microscopy with s- and p-polarized incident light

Optical Engineering ◽

10.1117/1.1287324 ◽

2000 ◽

Vol 39 (9) ◽

pp. 2495 ◽

Cited By ~ 1

Author(s):

Xin Chen

Keyword(s):

Optical Microscopy ◽

Force Constant ◽

Shear Force ◽

Incident Light ◽

Near Field ◽

Constant Intensity ◽

Constant Height

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Equivalence of constant-height and constant-intensity images in scanning near-field optical microscopy

Optics Letters ◽

10.1364/ol.21.001208 ◽

1996 ◽

Vol 21 (16) ◽

pp. 1208 ◽

Cited By ~ 13

Author(s):

Rémi Carminati ◽

Jean-Jacques Greffet

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Constant Intensity ◽

Constant Height ◽

Intensity Images

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A phase-locked shear-force microscope for distance regulation in near-field optical microscopy

Applied Physics Letters ◽

10.1063/1.118318 ◽

1997 ◽

Vol 70 (4) ◽

pp. 405-407 ◽

Cited By ~ 67

Author(s):

Walid A. Atia ◽

Christopher C. Davis

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Distance Regulation

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Shear force distance control in near-field optical microscopy: experimental evidence of the frictional probe–sample interaction

Ultramicroscopy ◽

10.1016/s0304-3991(99)00169-2 ◽

2000 ◽

Vol 83 (1-2) ◽

pp. 17-23 ◽

Cited By ~ 12

Author(s):

D.A Lapshin ◽

E.E Kobylkin ◽

V.S Letokhov

Keyword(s):

Experimental Evidence ◽

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Distance Control

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A novel ultrasonic resonance sample-tip distance regulation for near field optical microscopy and shear force microscopy

Solid State Communications ◽

10.1016/0038-1098(95)00787-3 ◽

1996 ◽

Vol 98 (7) ◽

pp. 661-664 ◽

Cited By ~ 10

Author(s):

X Zhu ◽

G.S Huang ◽

H.T Zhou ◽

Y.D Dai

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Force Microscopy ◽

Ultrasonic Resonance ◽

Shear Force Microscopy ◽

Distance Regulation

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Reflection Shear Force/Near-Field Scanning Optical Microscopy (NSOM)

Near Field Optics ◽

10.1007/978-94-011-1978-8_6 ◽

1993 ◽

pp. 45-50 ◽

Cited By ~ 3

Author(s):

P. J. Moyer ◽

M. A. Paesler

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Scanning Optical Microscopy ◽

Near Field Scanning

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Shear force/reflection near-field scanning optical microscopy

10.1117/12.146363 ◽

1993 ◽

Cited By ~ 9

Author(s):

Patrick J. Moyer ◽

Michael A. Paesler

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Force Reflection ◽

Scanning Optical Microscopy ◽

Near Field Scanning

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Shear force microscopy with capacitance detection for near‐field scanning optical microscopy

Applied Physics Letters ◽

10.1063/1.113269 ◽

1995 ◽

Vol 66 (11) ◽

pp. 1432-1434 ◽

Cited By ~ 23

Author(s):

J‐K. Leong ◽

C. C. Williams

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Force Microscopy ◽

Capacitance Detection ◽

Scanning Optical Microscopy ◽

Shear Force Microscopy ◽

Near Field Scanning

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Novel nonoptical method of tip-sample distance regulation based on shear force in scanning near-field optical microscopy

10.1117/12.347824 ◽

1999 ◽

Author(s):

Xiumei Liu ◽

Jia Wang ◽

Dacheng Li

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Distance Regulation ◽

Sample Distance

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