Electric-field-induced molecular reorientation dynamics by near-field scanning optical microscopy

1999 ◽  
Author(s):  
Daniel A. Higgins ◽  
Erwen Mei ◽  
Xiangmin Liao
Keyword(s):  
Electric Field ◽  
Optical Microscopy ◽  
Near Field ◽  
Molecular Reorientation ◽  
Reorientation Dynamics ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Combined electric field and near-field scanning optical microscopy: modification of silicon surfaces

1999 ◽  
Vol 68 (2) ◽  
pp. 177-180
Author(s):  
M. Tang ◽  
Y. Chen ◽  
J. Wang ◽  
M. Ouyang ◽  
S.M. Cai ◽  
...  
Keyword(s):  
Electric Field ◽  
Optical Microscopy ◽  
Near Field ◽  
Silicon Surfaces ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Raman imaging with near‐field scanning optical microscopy

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Raman Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
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