Nanometer-scale resolution and depth discrimination in near-field optical microscopy studies of electric-field-induced molecular reorientation dynamics

2000 ◽  
Vol 112 (18) ◽  
pp. 7839-7847 ◽  
Author(s):  
Erwen Mei ◽  
Daniel A. Higgins
Keyword(s):  
Electric Field ◽  
Optical Microscopy ◽  
Near Field ◽  
Nanometer Scale ◽  
Molecular Reorientation ◽  
Depth Discrimination ◽  
Reorientation Dynamics

Measurement of Strain Associated with Defects in SiTiO3 Bicrystals using Near-Field Scanning Optical Microscopy

1997 ◽  
Vol 474 ◽  
Author(s):  
E. B. McDaniel ◽  
J. W. P. Hsu
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Optical Microscope ◽  
Nanometer Scale ◽  
Polarization Modulation ◽  
Reflection Symmetry ◽  
Strain Fields ◽  
Modulation Technique ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

ABSTRACTWe incorporate a polarization modulation technique in a near-field scanning optical microscope (NSOM) for quantitative polarimetry studies at the nanometer scale. Using this technique, we map out stress-induced birefringence associated with submicron defects at the fusion boundaries of SiTiO3 bicrystals. The strain fields surrounding these defects are larger than the defect sizes and show complex spiral shapes that break the reflection symmetry of the bicrystal boundary.

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