Design and fabrication of soft x-ray photolithography experimental beam line at Beijing National Synchrotron Radiation Laboratory

1991 ◽  
Author(s):  
Changxin Zhou
2018 ◽  
Vol 24 (S2) ◽  
pp. 392-393
Author(s):  
Gang Liu ◽  
Liang Chen ◽  
Yong Guan

AbstractThe soft X-ray Microscopy beamline BL07W at National Synchrotron Radiation Laboratory is devoted to cryo nano-tomography for biological applications in the water window (284 - 530 eV) and for imaging of nanomaterials from 200 to 2500 eV. An ellipsoidal capillary used as condense to focus monochromatic light onto the sample. Two Ni zone plate (ZP) lenses made by Zeiss with 40 nm and 25 nm outer most zone widths, respectively, are available, giving spatial resolution in 2D of down to 40 nm and 30 nm, respectively. Hydrated biological specimens had been imaged in the water window photon energy range without chemical fixation, dehydration, chemical staining and physical sectioning. In addition, other applications such as nanomaterials imaging had been demonstrated.


Author(s):  
Cristiane Calza ◽  
Marcelino J. Anjos I ◽  
Sheila M.F. Mendonça de Souza ◽  
Antonio Brancaglion Jr ◽  
Ricardo T. Lopes

This work evaluates the chemical composition of pigments used in decorative paintings in the coffin cartonage fragments and linen wrappings of an Egyptian mummy, using X-ray microfluorescence with synchrotron radiation technique. The measures were obtained at the XRF beamline of the National Synchrotron Radiation Laboratory (LNLS). This Roman period female mummy is one of the most important mummies in the National Museum because of its unconventional embalming with disarticulated legs and arms. X-ray fluorescence analysis is a widely used spectroscopic technique in archaeometry for investigating the chemical composition of pigments in manuscripts, paintings, ceramics and other artifacts, metal alloys, and stones. Knowledge of composition allows pigment characterization through major or minor constituents, and makes it possible to establish the provenance, age, and consequently, the authenticity of the artifact.


1992 ◽  
pp. 995-1000 ◽  
Author(s):  
J. V. Gilfrich ◽  
E. F. Skelton ◽  
S. B. Qadri ◽  
N. E. Moulton ◽  
D. J. Nagel ◽  
...  

1991 ◽  
Vol 35 (B) ◽  
pp. 995-1000
Author(s):  
J.V. Gilfrich ◽  
E.F. Skelton ◽  
S.B. Qadri ◽  
N.E. Moulton ◽  
D.J. Nagel ◽  
...  

AbstractIt has been well established over recent years that synchrotron radiation possesses some unique features as a source of primary x-rays for x-ray fluorescence analysis. Advantage has been taken of the high intensity emanating from the bending magnets of storage rings to develop x-ray microprobes utilizing apertures or focussing optics, or both, to provide a beam spot at the specimen of the order of micrometers. The use of insertion devices wigglers and undulatora, can further increase the available intensity, especially for the high energy photons. Beam Line X-17C at the National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory, accepts the unmodified continuum radiation from a superconducting wiggler in the storage ring. Some initial XRF measurements have been made on this beam line using apertures in the 10 to 100 micrometer range. The fluorescent radiation was measured by an intrinsic Ge detector having an energy resolution of 300 eV at 15 kev, and located at 90° to the incident beam in the plane of the electron orbit. In samples containing many elements, detection limits of a few ppm were achieved with 100 μm beams.


2019 ◽  
Vol 4 (1) ◽  
pp. 7 ◽  
Author(s):  
Antonella Balerna

X-ray Absorption Fine Structure Spectroscopy (XAFS) is a powerful technique to investigate the local atomic geometry and the chemical state of atoms in different types of materials, especially if lacking a long-range order, such as nanomaterials, liquids, amorphous and highly disordered systems, and polymers containing metallic atoms. The INFN-LNF DAΦNE-Light DXR1 beam line is mainly dedicated to soft X-ray absorption spectroscopy; it collects the radiation of a wiggler insertion device and covers the energy range from 0.9 to 3.0 keV or the range going from the K-edge of Na through to the K-edge of Cl. The characteristics of the beamline are reported here together with the XAFS spectra of reference compounds, in order to show some of the information achievable with this X-ray spectroscopy. Additionally, some examples of XAFS spectroscopy applications are also reported.


Sign in / Sign up

Export Citation Format

Share Document