Line roughness improvements on EUV 36nm pitch pattern by plasma treatment method
2017 ◽
Vol 189
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pp. 012031
1998 ◽
Vol 37
(Part 1, No. 3A)
◽
pp. 771-775
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2021 ◽
Keyword(s):
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2016 ◽
Vol 871
◽
pp. 70-75
◽
2016 ◽
Vol 14
(8)
◽
pp. 1600199
◽
Keyword(s):