Fast electro-optics effect in strained silicon waveguide (Conference Presentation)

Author(s):  
Mathias Berciano ◽  
Guillaume Marcaud ◽  
Xavier Le Roux ◽  
Carlos A. Alonso-Ramos ◽  
Christian Lafforgue ◽  
...  
2008 ◽  
Vol 62 (3) ◽  
pp. 119-124
Author(s):  
Milan Milosevic ◽  
Petar Matavulj ◽  
Goran Mashanovich

In this paper we investigate the most popular silicon waveguide structures in the form of a silicon-on-insulator (SOI) rib waveguide. Single mode and birefringence free conditions in these relatively small waveguides are discussed and the influence of the top oxide cladding stress is analyzed. Field profiles for a wide range of waveguide cross section shapes and dimensions are systematically considered. Design guidelines for this type of SOI waveguides are presented.


Author(s):  
Mathias Berciano ◽  
Guillaume Marcaud ◽  
Pedro Damas ◽  
Xavier Le Roux ◽  
Carlos Alonso-Ramos ◽  
...  

2003 ◽  
Vol 765 ◽  
Author(s):  
Minjoo L. Lee ◽  
Eugene A. Fitzgerald

AbstractThe use of alternative channel materials such as germanium [1,2] and strained silicon (ε-Si) [3-5] is increasingly being considered as a method for improving the performance of MOSFETs. While ε-Si grown on relaxed Si1-x Gex is drawing closer to widespread commercialization, it is currently believed that almost all of the performance benefit in CMOS implementations will derive from the enhanced mobility of the n -MOSFET [5]. In this paper, we demonstrate that ε-Si p -MOSFETs can be engineered to exhibit mobility enhancements that increase or remain constant as a function of inversion density. We have also designed and fabricated ε-Si / ε-Ge dual-channel p -MOSFETs exhibiting mobility enhancements of 10 times. These p -MOSFETs can be integrated on the same wafers as ε-Si n -MOSFETs, making symmetric-mobility CMOS possible.


2007 ◽  
Author(s):  
Richard Zhu ◽  
Ernian Pan ◽  
Peter W. Chung ◽  
Xinli Cai ◽  
Kim M. Liew ◽  
...  

1988 ◽  
Vol 24 (6) ◽  
pp. 303 ◽  
Author(s):  
P.D. Colbourne ◽  
P.E. Jessop

2021 ◽  
Vol 130 (5) ◽  
pp. 055105
Author(s):  
Nicolas Roisin ◽  
Guillaume Brunin ◽  
Gian-Marco Rignanese ◽  
Denis Flandre ◽  
Jean-Pierre Raskin

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