Experimental evidence of nanometer-scale localized recombination due to random In fluctuations in InGaN/GaN quantum wells (Conference Presentation)

Author(s):  
Wiebke Hahn ◽  
Jean-Marie Lentali ◽  
Petr Polovodov ◽  
Nathan Young ◽  
James S. Speck ◽  
...  
1993 ◽  
Vol 03 (C5) ◽  
pp. 315-318
Author(s):  
B. ROTELLI ◽  
C. ARENA ◽  
L. TARRICONE ◽  
C. RIGO

2004 ◽  
Vol 85 (8) ◽  
pp. 1371-1373 ◽  
Author(s):  
Hsiang-Chen Wang ◽  
Shih-Chun Lin ◽  
Yen-Chen Lu ◽  
Yung-Chen Cheng ◽  
C. C. Yang ◽  
...  

1999 ◽  
Vol 588 ◽  
Author(s):  
S. Evoy ◽  
C. K. Harnett ◽  
S. Keller ◽  
U. K. Mishra ◽  
S. P. DenBaars ◽  
...  

AbstractWe present the scanning tunneling microscope-induced luminescence (STL) imaging of defects in optoelectronic materials. Resolution is first discussed using cross-sectional images of InGaAs/GaAs quantum dots. Proof of concept is then provided through the nanometer-scale imaging of GaN layers and quantum wells. The expected λ=356±25 nm range dominates the low temperature STL of GaN. Mapping of luminescence shows circular non-emitting areas around threading dislocations. Extent of dark areas suggests a hole diffusion length of Ld=30–55 nm, in agreement with reported values. The expected λ=450±35 nm range dominates the STL from a buried InGaN/GaN multiple quantum well. Imaging reveals 30–100 nm wide smooth fluctuations of luminescence.


2002 ◽  
Vol 81 (13) ◽  
pp. 2460-2462 ◽  
Author(s):  
A. F. G. Monte ◽  
S. W. da Silva ◽  
J. M. R. Cruz ◽  
P. C. Morais ◽  
A. S. Chaves

2015 ◽  
Vol 106 (18) ◽  
pp. 183901 ◽  
Author(s):  
Jean Rodière ◽  
Laurent Lombez ◽  
Alain Le Corre ◽  
Olivier Durand ◽  
Jean-François Guillemoles

2013 ◽  
Vol 88 (11) ◽  
Author(s):  
Arthur Losquin ◽  
Sophie Camelio ◽  
David Rossouw ◽  
Mondher Besbes ◽  
Frédéric Pailloux ◽  
...  

1995 ◽  
Vol 17 (11-12) ◽  
pp. 1473-1479
Author(s):  
D. Greco ◽  
R. Cingolani ◽  
A. D'Andrea ◽  
L. Tommasini ◽  
L. Vanzetti ◽  
...  

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