Determination of subsurface damage in single crystalline optical materials

Subsurface damage in some single crystalline optical materials

Applied Optics ◽

10.1364/ao.44.002241 ◽

2005 ◽

Vol 44 (12) ◽

pp. 2241 ◽

Cited By ~ 80

Author(s):

Joseph A. Randi ◽

John C. Lambropoulos ◽

Stephen D. Jacobs

Keyword(s):

Optical Materials ◽

Subsurface Damage ◽

Single Crystalline

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Determination of subsurface damage in optical materials using a non-invasive technique

Optical Fabrication and Testing ◽

10.1364/oft.2002.otub4 ◽

2002 ◽

Author(s):

Joseph Randi ◽

J.C. Lambropoulos ◽

S.D. Jacobs

Keyword(s):

Optical Materials ◽

Subsurface Damage ◽

Invasive Technique ◽

Non Invasive

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Quantitative determination of the activity of defect sites on a single‐crystalline surface: C–H bond activation of carbon‐13 labeled ethane on Ir(111)

The Journal of Chemical Physics ◽

10.1063/1.468383 ◽

1994 ◽

Vol 101 (7) ◽

pp. 6289-6300 ◽

Cited By ~ 18

Author(s):

Dale F. Johnson ◽

W. Henry Weinberg

Keyword(s):

Quantitative Determination ◽

Bond Activation ◽

Single Crystalline ◽

Defect Sites ◽

Crystalline Surface

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Mechanisms of material removal and subsurface damage in fixed-abrasive diamond wire slicing of single-crystalline silicon

Precision Engineering ◽

10.1016/j.precisioneng.2017.04.011 ◽

2017 ◽

Vol 50 ◽

pp. 32-43 ◽

Cited By ~ 31

Author(s):

Takaaki Suzuki ◽

Yuki Nishino ◽

Jiwang Yan

Keyword(s):

Material Removal ◽

Crystalline Silicon ◽

Subsurface Damage ◽

Single Crystalline Silicon ◽

Single Crystalline ◽

Diamond Wire ◽

Fixed Abrasive

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UV absorption mapping as subsurface damage inspection in transparent optical materials

Optics and Photonics for Advanced Dimensional Metrology ◽

10.1117/12.2555715 ◽

2020 ◽

Author(s):

Heidi Cattaneo ◽

Roelene Botha ◽

Carsten Ziolek

Keyword(s):

Optical Materials ◽

Subsurface Damage ◽

Uv Absorption

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Fundamental investigation of subsurface damage in single crystalline silicon caused by diamond machining

Precision Engineering ◽

10.1016/j.precisioneng.2008.10.008 ◽

2009 ◽

Vol 33 (4) ◽

pp. 378-386 ◽

Cited By ~ 137

Author(s):

Jiwang Yan ◽

Tooru Asami ◽

Hirofumi Harada ◽

Tsunemoto Kuriyagawa

Keyword(s):

Crystalline Silicon ◽

Subsurface Damage ◽

Single Crystalline Silicon ◽

Single Crystalline ◽

Diamond Machining ◽

Fundamental Investigation

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Relationship between subsurface damage and surface roughness of ground optical materials

Journal of Central South University of Technology ◽

10.1007/s11771-007-0105-1 ◽

2007 ◽

Vol 14 (4) ◽

pp. 546-551 ◽

Cited By ~ 4

Author(s):

Sheng-yi Li ◽

Zhuo Wang ◽

Yu-lie Wu

Keyword(s):

Surface Roughness ◽

Optical Materials ◽

Subsurface Damage

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Relationship between subsurface damage and surface roughness of optical materials in grinding and lapping processes

Journal of Materials Processing Technology ◽

10.1016/j.jmatprotec.2007.11.118 ◽

2008 ◽

Vol 205 (1-3) ◽

pp. 34-41 ◽

Cited By ~ 107

Author(s):

Shengyi Li ◽

Zhuo Wang ◽

Yulie Wu

Keyword(s):

Surface Roughness ◽

Optical Materials ◽

Subsurface Damage

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Thermal lens determination of the temperature coefficient of optical path length in optical materials

Review of Scientific Instruments ◽

10.1063/1.1524039 ◽

2003 ◽

Vol 74 (1) ◽

pp. 877-880 ◽

Cited By ~ 38

Author(s):

A. A. Andrade ◽

T. Catunda ◽

I. Bodnar ◽

J. Mura ◽

M. L. Baesso

Keyword(s):

Temperature Coefficient ◽

Thermal Lens ◽

Path Length ◽

Optical Materials ◽

Optical Path Length ◽

Optical Path

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21412 Determination of Optimum Birefi'ingences of Optical Materials through Design, Manufacturing and In-Service Processes by Controlling a Consistent Mechanical Parameter Based on the Inverse Analysis : Proposal of a New Concept and its Fundamental Formularization

The Proceedings of Conference of Kanto Branch ◽

10.1299/jsmekanto.2013.19.605 ◽

2013 ◽

Vol 2013.19 (0) ◽

pp. 605-606

Author(s):

Shinsuke OGAWA ◽

Haruo NAKAMURA

Keyword(s):

Inverse Analysis ◽

Optical Materials ◽

Mechanical Parameter

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