Precise characterization of optical thin films and compound semiconductor stacks using spectroscopic ellipsometry

2017 ◽  
Author(s):  
Jean-Claude Fouere
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Compound Semiconductor ◽  
Precise Characterization

Synthesis and Characterization of Layered Tin Monoxide Thin Films with Monocrystalline Structure on III-V Compound Semiconductor

2013 ◽  
Vol 1 (2) ◽  
pp. 1300022
Author(s):  
Pekka Laukkanen ◽  
Jouko Lång ◽  
Marko Punkkinen ◽  
Mikhail Kuzmin ◽  
Marjukka Tuominen ◽  
...  
Keyword(s):  
Thin Films ◽  
Compound Semiconductor ◽  
Synthesis And Characterization ◽  
Tin Monoxide

Optical characterization of CuIn1−xGaxSe2 alloy thin films by spectroscopic ellipsometry

2003 ◽  
Vol 94 (2) ◽  
pp. 879-888 ◽  
Author(s):  
P. D. Paulson ◽  
R. W. Birkmire ◽  
W. N. Shafarman
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization

Characterization of SiN thin films with spectroscopic ellipsometry

1993 ◽  
Vol 185 (1-4) ◽  
pp. 342-347 ◽  
Author(s):  
J. Petalas ◽  
S. Logothetidis ◽  
A. Markwitz ◽  
E.C. Paloura ◽  
R.L. Johnson ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry

Spectroscopic ellipsometry characterization of Er3+-dopedtitania thin films prepared by the sol-gel method

Optik ◽  
2001 ◽  
Vol 112 (7) ◽  
pp. 316-320 ◽  
Author(s):  
R. Palomino-Merino ◽  
A. Mendoza-Galván ◽  
G. Martínez ◽  
V. Castaño ◽  
R. Rodríguez
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Sol Gel ◽  
Gel Method ◽  
Sol Gel Method
Sign in / Sign up

Export Citation Format

Share Document