scholarly journals Development of multilayer coatings for hard x-ray optics at NASA Marshall Space Flight Center

2017 ◽  
Author(s):  
Danielle N. Gurgew ◽  
David M. Broadway ◽  
Brian D. Ramsey ◽  
Don Gregory
Keyword(s):  
Space Flight ◽  
Multilayer Coatings ◽  
Ray Optics ◽  
X Ray ◽  
Nasa Marshall Space

scholarly journals Full-shell x-ray optics development at NASA Marshall Space Flight Center

2019 ◽  
Vol 5 (02) ◽  
pp. 1 ◽  
Author(s):  
Kiranmayee Kilaru ◽  
Brian D. Ramsey ◽  
Wayne H. Baumgartner ◽  
Stephen D. Bongiorno ◽  
David M. Broadway ◽  
...  
Keyword(s):  
Space Flight ◽  
Ray Optics ◽  
X Ray ◽  
Nasa Marshall Space

scholarly journals X-ray optics at NASA Marshall Space Flight Center

2015 ◽  
Author(s):  
Stephen L. O'Dell ◽  
Carolyn Atkins ◽  
David M. Broadway ◽  
Ronald F. Elsner ◽  
Jessica A. Gaskin ◽  
...  
Keyword(s):  
Space Flight ◽  
Ray Optics ◽  
X Ray ◽  
Nasa Marshall Space

Formation and characterization of multilayer coatings for X-ray optics

Vacuum ◽  
1989 ◽  
Vol 39 (7-8) ◽  
pp. 711-716 ◽  
Author(s):  
J Verhoeven ◽  
E Puik ◽  
MJ van der Wiel
Keyword(s):  
Multilayer Coatings ◽  
Ray Optics ◽  
X Ray

Nanoscaled Multilayer Coatings for X‐Ray Optics

2008 ◽  
Vol 10 (7) ◽  
pp. 686-691 ◽  
Author(s):  
F. Hertlein ◽  
S. Kroth ◽  
C. Michaelsen ◽  
A. Oehr ◽  
J. Wiesmann
Keyword(s):  
Multilayer Coatings ◽  
Ray Optics ◽  
X Ray

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

Aperiodic multilayer structures in soft X-ray optics

2015 ◽  
Vol 185 (11) ◽  
pp. 1203-1214 ◽  
Author(s):  
Aleksandr S. Pirozhkov ◽  
Evgenii N. Ragozin
Keyword(s):  
Multilayer Structures ◽  
Ray Optics ◽  
X Ray
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