Resolution and degrees of freedom in near-field scanning microscopy

1995 ◽  
Author(s):  
Guiying Wang ◽  
Zhihua Ding ◽  
Zhifeng Fan ◽  
ZhiJiang Wang
Keyword(s):  
Degrees Of Freedom ◽  
Near Field ◽  
Scanning Microscopy ◽  
Near Field Scanning

Atomic force and near-field scanning microscopy of solid zFP538 films

2005 ◽  
Author(s):  
Nadya N. Zubova ◽  
Artem A. Astafyev ◽  
Andrew N. Petrukhin ◽  
Oleg M. Sarkisov ◽  
Alexander P. Savitsky
Keyword(s):  
Near Field ◽  
Scanning Microscopy ◽  
Atomic Force ◽  
Near Field Scanning

Near-field scanning microscopy and physico-chemical analysis versus time of SiCN:H thin films grown in Ar/NH3/TMS gas mixture using MW-Plasma CVD at 400 °C

2018 ◽  
Vol 15 (10) ◽  
pp. 1800066 ◽  
Author(s):  
Béatrice Plujat ◽  
Hervé Glénat ◽  
Jonathan Hamon ◽  
Yoan Gazal ◽  
Antoine Goullet ◽  
...  
Keyword(s):  
Thin Films ◽  
Chemical Analysis ◽  
Near Field ◽  
Scanning Microscopy ◽  
Gas Mixture ◽  
Plasma Cvd ◽  
Physico Chemical ◽  
Near Field Scanning

Fiber-laser probe for near-field scanning microscopy

1994 ◽  
Author(s):  
S. G. Grubb ◽  
E. Betzig ◽  
R. J. Chichester ◽  
D. J. DiGiovanni ◽  
J. S. Weiner
Keyword(s):  
Fiber Laser ◽  
Near Field ◽  
Scanning Microscopy ◽  
Laser Probe ◽  
Near Field Scanning

scholarly journals Full mapping of optical noise in photonic devices: an evaluation by near-field scanning microscopy

2008 ◽  
Vol 16 (13) ◽  
pp. 9513 ◽  
Author(s):  
Jean-Marie Moison ◽  
Izo Abram ◽  
Marcel Bensoussan
Keyword(s):  
Near Field ◽  
Photonic Devices ◽  
Scanning Microscopy ◽  
Optical Noise ◽  
Near Field Scanning

Contrast analysis of near-field scanning microscopy using a metal slit probe at millimeter wavelengths

2015 ◽  
Vol 118 (11) ◽  
pp. 114905 ◽  
Author(s):  
Tatsuo Nozokido ◽  
Manabu Ishino ◽  
Ryosuke Seto ◽  
Jongsuck Bae
Keyword(s):  
Near Field ◽  
Scanning Microscopy ◽  
Millimeter Wavelengths ◽  
Contrast Analysis ◽  
Near Field Scanning

Solvothermally Synthesized Sb2Te3Platelets Show Unexpected Optical Contrasts in Mid-Infrared Near-Field Scanning Microscopy

Nano Letters ◽  
2015 ◽  
Vol 15 (5) ◽  
pp. 2787-2793 ◽  
Author(s):  
Benedikt Hauer ◽  
Tobias Saltzmann ◽  
Ulrich Simon ◽  
Thomas Taubner
Keyword(s):  
Near Field ◽  
Scanning Microscopy ◽  
Mid Infrared ◽  
Near Field Scanning
Sign in / Sign up

Export Citation Format

Share Document