Line photogrammetry: a tool for precise localization of 3D points and lines in automated object reconstruction

Author(s):  
Eberhard Guelch
Author(s):  
Kendall Scott Wills ◽  
Omar Diaz de Leon ◽  
Kartik Ramanujachar ◽  
Charles P. Todd

Abstract In the current generations of devices the die and its package are closely integrated to achieve desired performance and form factor. As a result, localization of continuity failures to either the die or the package is a challenging step in failure analysis of such devices. Time Domain Reflectometry [1] (TDR) is used to localize continuity failures. However the accuracy of measurement with TDR is inadequate for effective localization of the failsite. Additionally, this technique does not provide direct 3-Dimenstional information about the location of the defect. Super-conducting Quantum Interference Device (SQUID) Microscope is useful in localizing shorts in packages [2]. SQUID microscope can localize defects to within 5um in the X and Y directions and 35um in the Z direction. This accuracy is valuable in precise localization of the failsite within the die, package or the interfacial region in flipchip assemblies.


Author(s):  
P. Larré ◽  
H. Tupin ◽  
C. Charles ◽  
R.H. Newton ◽  
A. Reverdy

Abstract As technology nodes continue to shrink, resistive opens have become increasingly difficult to detect using conventional methods such as AVC and PVC. The failure isolation method, Electron Beam Absorbed Current (EBAC) Imaging has recently become the preferred method in failure analysis labs for fast and highly accurate detection of resistive opens and shorts on a number of structures. This paper presents a case study using a two nanoprobe EBAC technique on a 28nm node test structure. This technique pinpointed the fail and allowed direct TEM lamella.


2019 ◽  
Vol 65 (4) ◽  
pp. 590-595
Author(s):  
Arkadiy Naumenko ◽  
Kseniya Sapova ◽  
Oleg Konoplev ◽  
Svetlana Astashchenko ◽  
Igor Chernushevich

Precise localization and excision of the originating site of a sinonasal inverted papilloma is essential for decreasing tumor recurrence. In this study we evaluated the use of preoperative computed tomography (CT) to pinpoint the attachment/origi-nating sites of the tumor.


IEEE Access ◽  
2021 ◽  
Vol 9 ◽  
pp. 110-121
Author(s):  
Ahmed J. Afifi ◽  
Jannes Magnusson ◽  
Toufique A. Soomro ◽  
Olaf Hellwich

2021 ◽  
Vol 423 ◽  
pp. 407-418
Author(s):  
Bo Peng ◽  
Wei Wang ◽  
Jing Dong ◽  
Tieniu Tan

Genomics ◽  
1995 ◽  
Vol 27 (2) ◽  
pp. 358-361 ◽  
Author(s):  
William Paradee ◽  
Chadwick Mullins ◽  
Zhanquan He ◽  
Thomas Glover ◽  
Charles Wilke ◽  
...  

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