Measuring the performance of adjustable x-ray optics with wavefront sensing

Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/j.nima.2018.03.026 ◽

2018 ◽

Vol 907 ◽

pp. 105-115 ◽

Cited By ~ 10

Author(s):

Daniele Cocco ◽

Mourad Idir ◽

Daniel Morton ◽

Lorenzo Raimondi ◽

Marco Zangrando

Keyword(s):

Wavefront Sensing ◽

Ray Optics ◽

Active Optics ◽

X Ray

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X-ray optics and beam characterization using random modulation: experiments

Journal of Synchrotron Radiation ◽

10.1107/s1600577520000508 ◽

2020 ◽

Vol 27 (2) ◽

pp. 293-304 ◽

Cited By ~ 2

Author(s):

Sebastien Berujon ◽

Ruxandra Cojocaru ◽

Pierre Piault ◽

Rafael Celestre ◽

Thomas Roth ◽

...

Keyword(s):

Online Optimization ◽

Minimum Amount ◽

Wavefront Sensing ◽

Optical Components ◽

Ray Optics ◽

Active Optics ◽

X Ray ◽

Wavefront Distortion ◽

Random Modulation ◽

Beam Characterization

A parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad. 27, 284–292] reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. Shown here are experimental applications of the technique for characterizing both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with a minimum amount of wavefront distortion. It is also recalled how such methods can facilitate online optimization of active optics.

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Grazing incidence wavefront sensing and verification of x-ray optics performance

10.1117/12.893404 ◽

2011 ◽

Cited By ~ 1

Author(s):

Timo T. Saha ◽

Scott Rohrbach ◽

William W. Zhang ◽

Tyler C. Evans ◽

Melinda Hong

Keyword(s):

Grazing Incidence ◽

Wavefront Sensing ◽

Ray Optics ◽

X Ray

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X-ray microprobe for materials science

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100168013 ◽

1994 ◽

Vol 52 ◽

pp. 56-57

Author(s):

G.E. Ice

Keyword(s):

Crystallographic Orientation ◽

Local Structure ◽

Materials Science ◽

Chemical Information ◽

X Ray Diffraction ◽

Ray Optics ◽

X Ray ◽

Novel Materials ◽

New Information ◽

Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

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