Pupil wavefront manipulation to compensate for mask topography effects in optical nanolithography

2013 ◽  
Author(s):  
Monica Kempsell Sears ◽  
Bruce W. Smith
2020 ◽  
pp. 41-140
Author(s):  
Bruce W. Smith

2010 ◽  
Vol 18 (7) ◽  
pp. 7369 ◽  
Author(s):  
Sreemanth M.V. Uppuluri ◽  
Edward C. Kinzel ◽  
Yan Li ◽  
Xianfan Xu

2004 ◽  
Vol 33 (4) ◽  
pp. 209-219
Author(s):  
V. V. Ivin ◽  
T. M. Makhviladze ◽  
K. A. Valiev

2014 ◽  
Vol 117 (1) ◽  
pp. 307-311 ◽  
Author(s):  
Xiaolei Wen ◽  
Luis M. Traverso ◽  
Pornsak Srisungsitthisunti ◽  
Xianfan Xu ◽  
Euclid E. Moon

2006 ◽  
Vol 6 (11) ◽  
pp. 3647-3651 ◽  
Author(s):  
Sangjin Kwon ◽  
Youngmo Jeong ◽  
Sungho Jeong

The uniformity and reproducibility of the photoresist nanopatterns fabricated using near-field scanning optical nanolithography (NSOL) are investigated. The nanopatterns could be used as nanomasks for pattern transfer on a silicon wafer. In the NSOL process, uniform patterning with high reproducibility is essential for reliable transfer of the mask patterns on a silicon substrate. Using an aperture type cantilever nanoprobe operated at contact mode and a positive photoresist, various nanopatterns are produced on thin photoresist layer coated on the silicon substrate. The size and shape variations of thereby produced patterns are investigated using atomic force microscope to determine their uniformity and reproducibility. It is demonstrated that the NSOL-produced photoresist nanomasks can be successfully applied for silicon pattern transfer by fabricating a silicon nanochannel array.


2006 ◽  
Vol 14 (21) ◽  
pp. 9902 ◽  
Author(s):  
Liang Wang ◽  
Eric X. Jin ◽  
Sreemanth M. Uppuluri ◽  
Xianfan Xu

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