New flying optical head for high-speed accessing

1990 ◽  
Author(s):  
Shouji Yamaguchi ◽  
Kaoru Yasukawa ◽  
Daisuke Iguchi ◽  
Kazuhiko Sumiya ◽  
Akemi Murakami ◽  
...  
Keyword(s):  
High Speed ◽  
Optical Head

Blue-violet 2-beam Optical Head for High-speed Recording

2003 ◽  
Author(s):  
K. Sasaki ◽  
D. Koide ◽  
H. Yanagisawa ◽  
H. Tokumaru ◽  
Y. Fujita
Keyword(s):  
High Speed ◽  
Optical Head

High Speed Accessing using Split Optical Head

1989 ◽  
Author(s):  
K. Koumura ◽  
F. Takizawa ◽  
T. Iwanaga ◽  
H. Inada ◽  
Y. Yamanaka ◽  
...  
Keyword(s):  
High Speed ◽  
Optical Head

High-speed plasmonic nanolithography with a solid immersion lens-based plasmonic optical head

2012 ◽  
Vol 101 (16) ◽  
pp. 161109 ◽  
Author(s):  
Taeseob Kim ◽  
Won-Sup Lee ◽  
Hang-Eun Joe ◽  
Geon Lim ◽  
Guk-Jong Choi ◽  
...  
Keyword(s):  
High Speed ◽  
Solid Immersion Lens ◽  
Optical Head ◽  
Plasmonic Nanolithography

Development of High Speed Magnetooptical Disk Drive Using 4 Beam Optical Head

1991 ◽  
Vol 6 (3) ◽  
pp. 250-260 ◽  
Author(s):  
T. Nakagomi ◽  
Y. Koiwa ◽  
N. Kuwayama ◽  
K. Sekiguchi ◽  
A. Hayashi
Keyword(s):  
High Speed ◽  
Disk Drive ◽  
Optical Head

Blue-Violet Two-Beam Optical Head for High-Speed Recording

2004 ◽  
Vol 43 (11A) ◽  
pp. 7508-7512 ◽  
Author(s):  
Kentaro Sasaki ◽  
Daiichi Koide ◽  
Hitoshi Yanagisawa ◽  
Haruki Tokumaru
Keyword(s):  
High Speed ◽  
Optical Head

High-speed swing arm three-beam optical head

1991 ◽  
Author(s):  
Aik Seng Yak ◽  
Tohsiew Low ◽  
Siak-Piang Lim
Keyword(s):  
High Speed ◽  
Optical Head ◽  
Swing Arm

Microfabrication research at the National Submicron Facility

1983 ◽  
Vol 41 ◽  
pp. 86-89
Author(s):  
E.D. Wolf
Keyword(s):  
Integrated Circuits ◽  
Particle Physics ◽  
High Speed ◽  
New Technology ◽  
High Energy ◽  
High Energy Particle ◽  
New Science ◽  
Wide Range ◽  
Intermediate Domain ◽  
Circuit Function

Most microelectronics devices and circuits operate faster, consume less power, execute more functions and cost less per circuit function when the feature-sizes internal to the devices and circuits are made smaller. This is part of the stimulus for the Very High-Speed Integrated Circuits (VHSIC) program. There is also a need for smaller, more sensitive sensors in a wide range of disciplines that includes electrochemistry, neurophysiology and ultra-high pressure solid state research. There is often fundamental new science (and sometimes new technology) to be revealed (and used) when a basic parameter such as size is extended to new dimensions, as is evident at the two extremes of smallness and largeness, high energy particle physics and cosmology, respectively. However, there is also a very important intermediate domain of size that spans from the diameter of a small cluster of atoms up to near one micrometer which may also have just as profound effects on society as “big” physics.

Vacuum System to Minimize the Specimen Contamination of High-Performance EM

1977 ◽  
Vol 35 ◽  
pp. 68-69
Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh
Keyword(s):  
Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
High Vacuum ◽  
Vacuum System ◽  
Pump System ◽  
Pumping System ◽  
Diffusion Pump ◽  
Almost All ◽  
Cascade Type

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.

The on-line use of histogram data for high-speed correction and alignment of electron microscope images

1984 ◽  
Vol 42 ◽  
pp. 556-557
Author(s):  
William Krakow
Keyword(s):  
Power Spectrum ◽  
High Speed ◽  
Direct Memory Access ◽  
Digital Television ◽  
Contrast Transfer Function ◽  
The Past ◽  
High Resolution Tem ◽  
On Line ◽  
Correction Of Astigmatism ◽  
The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

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