Bremsstrahlung optical monitoring system (BOMS) for in situ spectral characterization and optical film thickness monitoring of electron beam evaporated x-ray coatings and multilayers: design concept

1994 ◽  
Author(s):  
Muamer Zukic ◽  
Michele W. McColgan ◽  
Douglas G. Torr ◽  
Alphonsus J. Fennelly ◽  
Edward L. Fry
Keyword(s):  
Electron Beam ◽  
Film Thickness ◽  
Monitoring System ◽  
Design Concept ◽  
Spectral Characterization ◽  
Optical Monitoring ◽  
X Ray ◽  
Optical Film

Electron induced surface reactions of (η5-C5H5)Fe(CO)2Mn(CO)5, a potential heterobimetallic precursor for focused electron beam induced deposition (FEBID)

2018 ◽  
Vol 20 (11) ◽  
pp. 7862-7874 ◽  
Author(s):  
Ilyas Unlu ◽  
Julie A. Spencer ◽  
Kelsea R. Johnson ◽  
Rachel M. Thorman ◽  
Oddur Ingólfsson ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Electron Beam ◽  
Photoelectron Spectroscopy ◽  
Surface Reactions ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
X Ray ◽  
Electron Beam Induced Deposition

Electron-induced surface reactions of (η5-C5H5)Fe(CO)2Mn(CO)5were exploredin situunder ultra-high vacuum conditions using X-ray photoelectron spectroscopy and mass spectrometry.

Comparison of Electron-Beam Physical Vapor Deposition and Plasma-Spray Physical Vapor Deposition Thermal Barrier Coating Properties Using Synchrotron X-Ray Diffraction

2019 ◽  
Author(s):  
Matthew Northam ◽  
Lin Rossmann ◽  
Brooke Sarley ◽  
Bryan Harder ◽  
Jun-Sang Park ◽  
...  
Keyword(s):  
Electron Beam ◽  
High Temperature ◽  
Plasma Spray ◽  
Vapor Deposition ◽  
Physical Vapor Deposition ◽  
Thermal Barrier ◽  
Jet Engines ◽  
X Ray Diffraction ◽  
X Ray

Abstract Electron-beam physical vapor deposition (EB-PVD) is widely used for the application of thermal barrier coatings (TBCs) to turbine blades in jet engines. An emerging method, plasma-spray physical vapor deposition (PS-PVD), is a hybrid technique whereby coatings can be applied via the liquid phase to form lamellar microstructures or via the vapor to form columnar microstructures similar to that of EB-PVD. In this study, PS-PVD and conventional EB-PVD coated samples of a columnar configuration were prepared and thermally cycled to 300 and 600 cycles. These samples were subsequently characterized in-situ, under thermal load using synchrotron x-rays. From the high-resolution x-ray diffraction (XRD) patterns, the residual and in-situ strain in the TGO layer was obtained during a thermal cycle. At high temperature, the TGO layer for both deposition methods displayed a constant near zero-strain for all samples as anticipated. In the samples with 300 thermal cycles, both deposition methods showed similar strain profiles in the TGO layer. For samples with 600 cycles, PS-PVD samples showed a more significant strain relief in the TGO at room temperature compared to similarly cycled EB-PVD samples. This could explain the coating lifetime performance between the two deposition methods. The findings support ongoing efforts to tune the manufacturing of PS-PVD coatings towards the goal of meeting or exceeding the performance of currently used coatings on jet engines. This will pave the way for more affordable high temperature coating alternatives that meet durability needs.

An in-situ monitoring system for electron beam wire-feed additive manufacturing

2020 ◽  
Vol 307 ◽  
pp. 111983 ◽  
Author(s):  
Jiaqi Guo ◽  
Anguo Huang ◽  
Renzhi Hu ◽  
Haiying Xu ◽  
Guang Yang ◽  
...  
Keyword(s):  
Electron Beam ◽  
Additive Manufacturing ◽  
Monitoring System ◽  
In Situ Monitoring ◽  
Feed Additive ◽  
Wire Feed

scholarly journals Laboratory X-ray Diffraction Complex for In Situ Investigations of Structural Phase Evolution of Materials under Gaseous Atmosphere

Metals ◽  
2020 ◽  
Vol 10 (4) ◽  
pp. 447 ◽  
Author(s):  
Maxim Syrtanov ◽  
Georgiy Garanin ◽  
Egor Kashkarov ◽  
Natalia Pushilina ◽  
Viktor Kudiiarov ◽  
...  
Keyword(s):  
Electron Beam ◽  
Hydrogen Pressure ◽  
Structural Phase ◽  
Phase Evolution ◽  
Gaseous Atmosphere ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ti Powder ◽  
Cp Ti

In this work, a laboratory X-ray diffraction complex for in situ investigations of structural phase evolution of materials under gaseous atmosphere and elevated temperatures was developed. The approbation of the complex was carried out using a commercially pure titanium (CP-Ti) powder, zirconium (Zr-1Nb) alloy and electron beam melted Ti-6Al-4V alloy. It was established that hydrogenation of the CP-Ti powder occurred at a temperature of 500 °C and a hydrogen pressure of 0.5 atm, accompanied by the formation of metastable γ titanium hydride (γ-TiH) phase. The lifetime of the γ-TiH phase was 35–40 min. Decomposition of the γ-TiH occurred after reaching a temperature of 650 °C as a result of the thermally stimulated desorption of hydrogen. The α-Zr → δ-ZrH phase transformation was observed under hydrogenation of the zirconium Zr-1Nb alloy at a temperature of 350 °C and a hydrogen pressure of 0.5 atm. It was revealed that the increase in hydrogenation temperature to 450 °C accelerated this transformation by two times. Hydrogenation of the electron beam melted titanium Ti-6Al-4V alloy at a temperature of 650 °C and hydrogen pressure of 0.5 atm was accompanied by the α → α + β → β + α2 phase transformations.

The radiation chemistry of focused electron-beam induced etching of copper in liquids

Nanoscale ◽  
2019 ◽  
Vol 11 (24) ◽  
pp. 11550-11561 ◽  
Author(s):  
Sarah K. Lami ◽  
Gabriel Smith ◽  
Eric Cao ◽  
J. Todd Hastings
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Film Thickness ◽  
Radiation Chemistry ◽  
Environmental Scanning ◽  
System P ◽  
Scanning Electron

Well-controlled, focused electron-beam induced etching of copper thin films has been successfully conducted on bulk substrates in an environmental scanning electron microscope by controlling liquid-film thickness with an in situ correlative interferometry system.

Electron beam induced x-ray emission: An in situ probe for composition determination during molecular beam epitaxy growth

1998 ◽  
Vol 73 (24) ◽  
pp. 3580-3582 ◽  
Author(s):  
Joseph G. Pellegrino ◽  
John Armstrong ◽  
Jeremiah Lowney ◽  
Barbara DiCamillo ◽  
Joseph C. Woicik
Keyword(s):  
Electron Beam ◽  
Molecular Beam Epitaxy ◽  
Molecular Beam ◽  
Molecular Beam Epitaxy Growth ◽  
X Ray ◽  
Composition Determination

scholarly journals In Situ Biaxial Texture Analysis of Mgo Films During Growth on Amorphous Substrates by Ion Beam-Assisted Deposition

2001 ◽  
Vol 672 ◽  
Author(s):  
Rhett T. Brewer ◽  
Paul N. Arendt ◽  
James R. Groves ◽  
Harry A. Atwater
Keyword(s):  
Film Thickness ◽  
Ion Beam ◽  
Orientation Distribution ◽  
X Ray ◽  
Biaxial Texture ◽  
Plane Orientation ◽  
Transmission Electron ◽  
Out Of Plane ◽  
Amorphous Substrates

ABSTRACTWe used a previously reported kinematical electron scattering model1 to develop a RHEED based method for performing quantitative analysis of mosaic polycrystalline thin film in-plane and out-of-plain grain orientation distributions. RHEED based biaxial texture measurements are compared to X-Ray and transmission electron microscopy measurements to establish the validity of the RHEED analysis method. In situ RHEED analysis reveals that the out-of-plane orientation distribution starts out very broad, and then decreases during IBAD MgO growth. Other results included evidence that the in-plane orientation distribution narrows, the grain size increases, and the film roughens as film thickness increases during IBAD MgO growth. Homoepitaxy of MgO improves the biaxial texture of the IBAD layer, making X-ray measurements of IBAD films with an additional homoepitaxial layer not quantitatively representative of the IBAD layer. Systematic offsets between RHEED analysis and X-ray measurements of biaxial texture, coupled with evidence that biaxial texture improves with increasing film thickness, indicate that RHEED is a superior technique for probing surface biaxial texture.

In-Situ measurements of plane spacing during electromigration in a passivated AI line

1996 ◽  
Vol 54 ◽  
pp. 242-243
Author(s):  
P.-C. Wang ◽  
I. C. Noyan ◽  
E. G. Liniger ◽  
C.-K. Hu ◽  
G. S. Cargill
Keyword(s):  
Grain Size ◽  
Solid State ◽  
Film Thickness ◽  
Current Flow ◽  
Material Transport ◽  
Solid State Detector ◽  
Strain Measurements ◽  
X Ray ◽  
State Detector

To determine the effect of confinement on the material transport that occurs during electromigration, in-situ x-ray strain measurements were conducted along the length of a passivated Al line that was first heated (in two steps) to 267°C and then subjected to current flow.The specimen geometry used in the experiment is shown in Figure 1. Further details can be obtained from references 1,2. The Al in the line and the contact pads had a grain size of the order of the film thickness (0.5 μm) and exhibited strong 111 texture with a range of ±5 degrees. The W pads also exhibited strong 110 texture and had much finer grain size. The x-ray measurements were carried out on the NSLS X-26C beamline using a focussing tapered capillary for collimating the beam. The irradiated area on the line was a 10μmx10μm square. The Al 111 plane spacing (d111) was measured using white beam (Laue) diffraction with a solid-state detector. This plane spacing was measured at different locations along the line.

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