scholarly journals In situ beam drift detection using a two-dimensional electron-beam position monitoring system for multiple-electron-beam–direct-write lithography

1999 ◽  
Author(s):  
Hitoshi Sunaoshi ◽  
Munehiro Ogasawara ◽  
Jun Takamatsu ◽  
Naoharu Shimomura

Author(s):  
C. H. Kuo ◽  
P. C. Chiu ◽  
Jenny Chen ◽  
K.H. Hu ◽  
K. T. Hsu

Author(s):  
K. Shinoe ◽  
T. Koseki ◽  
Y. Kamiya ◽  
N. Nakamura ◽  
T. Katsura ◽  
...  

Author(s):  
S. W Jang ◽  
E.-S. Kim ◽  
A. Heo ◽  
Y. Honda ◽  
T. Tauchi ◽  
...  

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