Recent in-situ studies of the evolution of surfaces and interfaces of thin films by spectroscopic phase-modulated ellipsometry
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2018 ◽
Vol 81
(11)
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pp. 1250-1256
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1998 ◽
Vol 43
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pp. 631-634
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1996 ◽
Vol 35
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pp. 357-373
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2013 ◽
Vol 4
(9)
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pp. 1512-1518
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2001 ◽
Vol 148
(6)
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pp. C427
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2005 ◽
Vol 238
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pp. 319-322
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