An optimized sample preparation approach for atomic resolution in situ studies of thin films
2018 ◽
Vol 81
(11)
◽
pp. 1250-1256
◽
Keyword(s):
1998 ◽
Vol 43
(5-6)
◽
pp. 631-634
◽
1996 ◽
Vol 35
(3-4)
◽
pp. 357-373
◽
Keyword(s):
2018 ◽
Vol 24
(S1)
◽
pp. 84-85
◽