Subpixel sensitivity maps for a back-illuminated charge-coupled device and the effects of nonuniform response on measurement accuracy

2002 ◽  
Vol 41 (6) ◽  
pp. 1192 ◽  
Author(s):  
Albert Piterman
Keyword(s):  
Measurement Accuracy ◽  
Charge Coupled Device ◽  
Back Illuminated ◽  
Sensitivity Maps

scholarly journals New Developments in CCD Technology for the UV-EUV Spectral Range

1995 ◽  
Vol 167 ◽  
pp. 39-48
Author(s):  
Giovanni Bonanno
Keyword(s):  
Quantum Efficiency ◽  
Spectral Range ◽  
Spectral Region ◽  
Ultraviolet Astronomy ◽  
Charge Coupled Device ◽  
New Developments ◽  
X Ray ◽  
Ccd Detectors ◽  
Back Illuminated ◽  
Ion Implanted

Lately, Charge Coupled Device (CCD) detectors have had great advances both in the visible and in the X-ray spectral range. However, the technology applied to these devices in the ultraviolet (UV) spectral region has not developed as well, because of some problems connected with the interaction between UV radiation and the materials typically used in semiconductor technology. In our laboratory the ultraviolet response of some UV-enhanced CCDs has been investigated. In particular, the quantum efficiency of coronene and lumigen coated and of back-illuminated ion implanted CCDs have been measured in the 304–11000 å spectral range. Very interesting results have been found, mainly for a one ion implanted CCD with quantum efficiency values of more than 60% at 304 å. Some measurements of the response uniformity of this spectral region have also been made. The results obtained encourage the possible use of these detectors in ultraviolet astronomy with very good performance.

Direct X-Ray Imaging of µm Precision Using Back-Illuminated Charge-Coupled Device

2002 ◽  
Vol 41 (Part 2, No. 5A) ◽  
pp. L500-L501 ◽  
Author(s):  
Emi Miyata ◽  
Masami Miki ◽  
Hiroshi Tsunemi ◽  
Junko Hiraga ◽  
Hirohiko Kouno ◽  
...  
Keyword(s):  
Charge Coupled Device ◽  
X Ray ◽  
X Ray Imaging ◽  
Back Illuminated

scholarly journals Application of the Mesh Experiment for the Back-Illuminated Charge-Coupled Device: I. Experiment and the Charge Cloud Shape

2002 ◽  
Vol 41 (Part 1, No. 9) ◽  
pp. 5827-5834 ◽  
Author(s):  
Emi Miyata ◽  
Masami Miki ◽  
Junko Hiraga ◽  
Hirohiko Kouno ◽  
Kazutoshi Yasui ◽  
...  
Keyword(s):  
Charge Coupled Device ◽  
Charge Cloud ◽  
Back Illuminated

scholarly journals Measurement of the Charge Cloud Shape Generated in the Fully Depleted Back-Illuminated Charge-Coupled Device

2003 ◽  
Vol 42 (Part 1, No. 11) ◽  
pp. 7135-7139 ◽  
Author(s):  
Emi Miyata ◽  
Masami Miki ◽  
Daisuke Kamiyama ◽  
Hiroshi Tsunemi ◽  
Kazuhisa Miyaguchi
Keyword(s):  
Charge Coupled Device ◽  
Fully Depleted ◽  
Charge Cloud ◽  
Back Illuminated

Back-illuminated 2048 x 2048 charge-coupled device performance

1992 ◽  
Author(s):  
Kristie W. Gladhill ◽  
Morley Blouke ◽  
Pauline Marriott ◽  
Thomas G. Houck ◽  
Brian L. Corrie ◽  
...  
Keyword(s):  
Device Performance ◽  
Charge Coupled Device ◽  
Back Illuminated

Optimizing low-light microscopy with back-illuminated electron multiplying charge-coupled device: enhanced sensitivity, speed, and resolution

2004 ◽  
Vol 9 (6) ◽  
pp. 1244 ◽  
Author(s):  
Colin G. Coates ◽  
Donal J. Denvir ◽  
Noel G. McHale ◽  
Keith D. Thornbury ◽  
Mark A. Hollywood
Keyword(s):  
Light Microscopy ◽  
Low Light ◽  
Charge Coupled Device ◽  
Enhanced Sensitivity ◽  
Back Illuminated

scholarly journals Intra-Pixel Sensitivity Variation and Charge Transfer Inefficiency — Results of CCD Scans

2005 ◽  
Vol 22 (3) ◽  
pp. 257-266 ◽  
Author(s):  
Hiroyuki Toyozumi ◽  
Michael C. B. Ashley
Keyword(s):  
Charge Transfer ◽  
High Precision ◽  
Response Functions ◽  
Electrode Structure ◽  
Charge Coupled Device ◽  
Three Phase ◽  
A Charge ◽  
Sensitivity Maps

AbstractThe efficiency with which a charge-coupled device (CCD) detects photons depends, amongst other factors, on where within a pixel the photon hits. To explore this effect we have made detailed scans across a pixel for a front-illuminated three-phase EEV05-20 CCD using the standard astronomical B, V, R, and I colour filters. Pixel response functions and photometric sensitivity maps are derived from the scan images. Nonlinear charge transfer inefficiency (CTI) effects were observed and corrected for. The resulting images clearly show the intra-pixel sensitivity variations (IPSVs) due to the CCD electrode structure, and its dependence on wavelength. We briefly comment on the implications of IPSVs and CTI for high-precision photometry and astrometry.

scholarly journals High-precision small-scale laser focal spot measurements

2013 ◽  
Vol 31 (1) ◽  
pp. 177-183 ◽  
Author(s):  
Z.W. Lu ◽  
X.Y. Liu ◽  
X. Wang ◽  
D.X. Ba ◽  
Z.H. Jiang ◽  
...  
Keyword(s):  
Background Noise ◽  
Measurement Accuracy ◽  
Focal Spot ◽  
Small Scale ◽  
Two Dimensional ◽  
Charge Coupled Device ◽  
Spot Diameter ◽  
Focal Spot Diameter ◽  
Laser Focal Spot ◽  
Better Than

AbstractIn this paper, a method of two-dimensional fine-scanning with charge coupled device has been conducted to precisely measure spatial position and intensity distribution of small-scale focal spot (diameter in microns). The measurement accuracy of the small-scale focal spot position is better than 1 µm when the fluctuations of the light energy and background noise are relatively small. The theoretical analysis is consistent with the experimental results.

Characterization of a deep depletion, back-illuminated charge-coupled device in the x-ray range

2005 ◽  
Vol 76 (11) ◽  
pp. 116101 ◽  
Author(s):  
Flavio Zamponi ◽  
Tino Kämpfer ◽  
Andreas Morak ◽  
Ingo Uschmann ◽  
Eckhart Förster
Keyword(s):  
Charge Coupled Device ◽  
X Ray ◽  
Back Illuminated
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