Characterization of a deep depletion, back-illuminated charge-coupled device in the x-ray range

2005 ◽  
Vol 76 (11) ◽  
pp. 116101 ◽  
Author(s):  
Flavio Zamponi ◽  
Tino Kämpfer ◽  
Andreas Morak ◽  
Ingo Uschmann ◽  
Eckhart Förster
Keyword(s):  
Charge Coupled Device ◽  
X Ray ◽  
Back Illuminated

scholarly journals Characterization of a back-illuminated CMOS camera for soft x-ray coherent scattering

2019 ◽  
Author(s):  
Kewin Desjardins ◽  
Horia Popescu ◽  
Pascal Mercère ◽  
Claude Menneglier ◽  
Roland Gaudemer ◽  
...  
Keyword(s):  
Coherent Scattering ◽  
Cmos Camera ◽  
X Ray ◽  
Back Illuminated

Characterization of an x-ray framing camera utilizing a charge coupled device or film as recording media

1998 ◽  
Vol 69 (12) ◽  
pp. 4054-4060 ◽  
Author(s):  
L. M. Logory ◽  
D. R. Farley ◽  
A. D. Conder ◽  
E. A. Belli ◽  
P. M. Bell ◽  
...  
Keyword(s):  
Recording Media ◽  
Charge Coupled Device ◽  
X Ray ◽  
A Charge ◽  
Framing Camera

scholarly journals New Developments in CCD Technology for the UV-EUV Spectral Range

1995 ◽  
Vol 167 ◽  
pp. 39-48
Author(s):  
Giovanni Bonanno
Keyword(s):  
Quantum Efficiency ◽  
Spectral Range ◽  
Spectral Region ◽  
Ultraviolet Astronomy ◽  
Charge Coupled Device ◽  
New Developments ◽  
X Ray ◽  
Ccd Detectors ◽  
Back Illuminated ◽  
Ion Implanted

Lately, Charge Coupled Device (CCD) detectors have had great advances both in the visible and in the X-ray spectral range. However, the technology applied to these devices in the ultraviolet (UV) spectral region has not developed as well, because of some problems connected with the interaction between UV radiation and the materials typically used in semiconductor technology. In our laboratory the ultraviolet response of some UV-enhanced CCDs has been investigated. In particular, the quantum efficiency of coronene and lumigen coated and of back-illuminated ion implanted CCDs have been measured in the 304–11000 å spectral range. Very interesting results have been found, mainly for a one ion implanted CCD with quantum efficiency values of more than 60% at 304 å. Some measurements of the response uniformity of this spectral region have also been made. The results obtained encourage the possible use of these detectors in ultraviolet astronomy with very good performance.

Direct X-Ray Imaging of µm Precision Using Back-Illuminated Charge-Coupled Device

2002 ◽  
Vol 41 (Part 2, No. 5A) ◽  
pp. L500-L501 ◽  
Author(s):  
Emi Miyata ◽  
Masami Miki ◽  
Hiroshi Tsunemi ◽  
Junko Hiraga ◽  
Hirohiko Kouno ◽  
...  
Keyword(s):  
Charge Coupled Device ◽  
X Ray ◽  
X Ray Imaging ◽  
Back Illuminated

scholarly journals The use and characterization of a backilluminated charge-coupled device in investigations of pulsed x-ray and radiation sources

2008 ◽  
Vol 79 (10) ◽  
pp. 103302 ◽  
Author(s):  
Wilfred Fullagar ◽  
Jens Uhlig ◽  
Monika Walczak ◽  
Sophie Canton ◽  
Villy Sundström
Keyword(s):  
Charge Coupled Device ◽  
X Ray ◽  
Radiation Sources

Soft X-Ray Responsivities of Fully Depleted Back-Illuminated Charge-Coupled Device

2006 ◽  
Vol 45 (No. 22) ◽  
pp. L572-L574
Author(s):  
Emi Miyata ◽  
Hideki Ozawa ◽  
Daisuke Matsuura ◽  
Kazuhiro Ikegami ◽  
Masakuni Tohiguchi ◽  
...  
Keyword(s):  
Charge Coupled Device ◽  
Fully Depleted ◽  
X Ray ◽  
Back Illuminated

Diffraction imaging of polycrystalline materials

1991 ◽  
Vol 6 (7) ◽  
pp. 1469-1476 ◽  
Author(s):  
David R. Black ◽  
Harold E. Burdette ◽  
Masao Kuriyama ◽  
Richard D. Spal
Keyword(s):  
Imaging System ◽  
Imaging Technique ◽  
Polycrystalline Materials ◽  
Charge Coupled Device ◽  
X Ray ◽  
Diffraction Imaging ◽  
Residual Strains ◽  
Individual Grains ◽  
Ccd Detectors

A new diffraction imaging technique for the characterization of polycrystalline materials is proposed and applied to obtain direct information about individual grains and their size and shape distributions and, in turn, strains in these materials. Unlike traditional powder diffractometry, where divergent and focusing x-ray optics are essential to collect information from an ensemble of grains, the nearly parallel and monochromatic beam available from a synchrotron x-ray source is employed to observe and measure diffraction images from individual grains and component particles in consolidated materials prepared by various processes. Images can be recorded by traditional methods, such as film and pulse counting detectors, but modern image detectors, such as charge coupled device (CCD) detectors and image analyzers, make the proposed imaging technique more practical. Unlike traditional diffractometry, this new technique provides the ability to measure shape, size, and strain without model based analyses. The spatial distribution of strain within individual grains, displayed as a diffraction image (topograph), indicates the presence of defects, such as dislocations, subgrain boundaries, and precipitates, and sheds new light on the origins of residual strains (stresses) in industrial materials. The resolution of the imaging system used is limited to grains ∼10 μm or larger due to diffraction broadening (∼20” from the size effect) and the resolution of the recording medium.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

High Resolution Replication of Organoclay Surfaces

1982 ◽  
Vol 40 ◽  
pp. 576-577
Author(s):  
W. W. Barker ◽  
W. E. Rigsby ◽  
V. J. Hurst ◽  
W. J. Humphreys
Keyword(s):  
Clay Mineral ◽  
Organic Molecule ◽  
Organic Molecules ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
X Ray ◽  
Naturally Occurring ◽  
Silicate Layers ◽  
Mineral Identification

Experimental clay mineral-organic molecule complexes long have been known and some of them have been extensively studied by X-ray diffraction methods. The organic molecules are adsorbed onto the surfaces of the clay minerals, or intercalated between the silicate layers. Natural organo-clays also are widely recognized but generally have not been well characterized. Widely used techniques for clay mineral identification involve treatment of the sample with H2 O2 or other oxidant to destroy any associated organics. This generally simplifies and intensifies the XRD pattern of the clay residue, but helps little with the characterization of the original organoclay. Adequate techniques for the direct observation of synthetic and naturally occurring organoclays are yet to be developed.

Digital x-ray mapping of nanometer-size supported bimetallic catalysts

1988 ◽  
Vol 46 ◽  
pp. 530-531
Author(s):  
L. T. Germinario
Keyword(s):  
Background Radiation ◽  
Metal Cluster ◽  
Single Element ◽  
Beam Diameter ◽  
X Rays ◽  
X Ray ◽  
Major Interest ◽  
Induced Changes

Understanding the role of metal cluster composition in determining catalytic selectivity and activity is of major interest in heterogeneous catalysis. The electron microscope is well established as a powerful tool for ultrastructural and compositional characterization of support and catalyst. Because the spatial resolution of x-ray microanalysis is defined by the smallest beam diameter into which the required number of electrons can be focused, the dedicated STEM with FEG is the instrument of choice. The main sources of errors in energy dispersive x-ray analysis (EDS) are: (1) beam-induced changes in specimen composition, (2) specimen drift, (3) instrumental factors which produce background radiation, and (4) basic statistical limitations which result in the detection of a finite number of x-ray photons. Digital beam techniques have been described for supported single-element metal clusters with spatial resolutions of about 10 nm. However, the detection of spurious characteristic x-rays away from catalyst particles produced images requiring several image processing steps.

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