scholarly journals Effect of O2 plasma exposure time during atomic layer deposition of amorphous gallium oxide

2021 ◽  
Vol 39 (5) ◽  
pp. 052408
Author(s):  
Hanno Kröncke ◽  
Florian Maudet ◽  
Sourish Banerjee ◽  
Jürgen Albert ◽  
Sven Wiesner ◽  
...  
Coatings ◽  
2020 ◽  
Vol 10 (7) ◽  
pp. 692
Author(s):  
Jong Hyeon Won ◽  
Seong Ho Han ◽  
Bo Keun Park ◽  
Taek-Mo Chung ◽  
Jeong Hwan Han

Herein, we performed a comparative study of plasma-enhanced atomic layer deposition (PEALD) of SnO2 films using Sn(dmamp)2 as the Sn source and either H2O plasma or O2 plasma as the oxygen source in a wide temperature range of 100–300 °C. Since the type of oxygen source employed in PEALD determines the growth behavior and resultant film properties, we investigated the growth feature of both SnO2 PEALD processes and the various chemical, structural, morphological, optical, and electrical properties of SnO2 films, depending on the oxygen source. SnO2 films from Sn(dmamp)2/H2O plasma (SH-SnO2) and Sn(dmamp)2/O2 plasma (SO-SnO2) showed self-limiting atomic layer deposition (ALD) growth behavior with growth rates of ~0.21 and 0.07–0.13 nm/cycle, respectively. SO-SnO2 films showed relatively larger grain structures than SH-SnO2 films at all temperatures. Interestingly, SH-SnO2 films grown at high temperatures of 250 and 300 °C presented porous rod-shaped surface morphology. SO-SnO2 films showed good electrical properties, such as high mobility up to 27 cm2 V−1·s−1 and high carrier concentration of ~1019 cm−3, whereas SH-SnO2 films exhibited poor Hall mobility of 0.3–1.4 cm2 V−1·s−1 and moderate carrier concentration of 1 × 1017–30 × 1017 cm−3. This may be attributed to the significant grain boundary and hydrogen impurity scattering.


2011 ◽  
Vol 29 (2) ◽  
pp. 021016 ◽  
Author(s):  
N. Leick ◽  
R. O. F. Verkuijlen ◽  
L. Lamagna ◽  
E. Langereis ◽  
S. Rushworth ◽  
...  

2019 ◽  
Vol 40 (1) ◽  
pp. 012806 ◽  
Author(s):  
Hui Hao ◽  
Xiao Chen ◽  
Zhengcheng Li ◽  
Yang Shen ◽  
Hu Wang ◽  
...  

AIP Advances ◽  
2019 ◽  
Vol 9 (4) ◽  
pp. 045019 ◽  
Author(s):  
Fumikazu Mizutani ◽  
Shintaro Higashi ◽  
Mari Inoue ◽  
Toshihide Nabatame

2015 ◽  
Vol E98.C (5) ◽  
pp. 382-389 ◽  
Author(s):  
P. Pungboon PANSILA ◽  
Kensaku KANOMATA ◽  
Bashir AHMMAD ◽  
Shigeru KUBOTA ◽  
Fumihiko HIROSE

2017 ◽  
Vol 35 (1) ◽  
pp. 01B130 ◽  
Author(s):  
Akhil Sharma ◽  
Valentino Longo ◽  
Marcel A. Verheijen ◽  
Ageeth A. Bol ◽  
W. M. M. (Erwin) Kessels

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