scholarly journals Analysis of LiCoO2 electrodes through principal component analysis of current–voltage datacubes measured using atomic force microscopy

2021 ◽  
Vol 39 (1) ◽  
pp. 012402
Author(s):  
Yasushi Maeda ◽  
Noboru Taguchi ◽  
Hikari Sakaebe
Keyword(s):  
Principal Component Analysis ◽  
Atomic Force Microscopy ◽  
Principal Component ◽  
Component Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage

scholarly journals The effect of hydrogen etching on 6H-SiC studied by temperature-dependent current-voltage and atomic force microscopy

2004 ◽  
Vol 85 (9) ◽  
pp. 1547-1549 ◽  
Author(s):  
S. Doğan ◽  
D. Johnstone ◽  
F. Yun ◽  
S. Sabuktagin ◽  
J. Leach ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Temperature Dependent ◽  
Hydrogen Etching ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage

Atomic Force Microscopy of the Local Electrical Properties of Bilayer Polyaniline-Polystyrene/P(VDF-TrFE) Composite

2021 ◽  
Vol 899 ◽  
pp. 506-511
Author(s):  
Artem V. Budaev ◽  
Ivanna N. Melnikovich ◽  
Vasily E. Melnichenko ◽  
Nikita A. Emelianov
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Polymer Nanocomposite ◽  
Charge Carriers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage ◽  
Current Voltage Characteristics ◽  
Piezoelectric Force Microscopy ◽  
Microscopy Techniques

Atomic force microscopy techniques (conductive-AFM, I-V spectroscopy and PFM) were used for characterisation of the local electrical properties of bilayer polyaniline-polystyrene/P(VDF-TrFE) polymer nanocomposite. Observed hysteresis of current-voltage characteristics confirms its memristive properties. It was caused by the influence of the ferroelectric polarization of P(VDF-TrFE) layer, the domain structure of which was visualised by piezoelectric force microscopy on the transport of charge carriers at the interface.

Label-free detection of biotoxins via a photo-induced force infrared spectrum at the single-molecular level

The Analyst ◽  
2019 ◽  
Vol 144 (20) ◽  
pp. 6108-6117 ◽  
Author(s):  
Bin Ji ◽  
Ahmad Kenaan ◽  
Shan Gao ◽  
Jin Cheng ◽  
Daxiang Cui ◽  
...  
Keyword(s):  
Principal Component Analysis ◽  
Infrared Spectrum ◽  
Single Molecule ◽  
Molecular Level ◽  
Principal Component ◽  
Component Analysis ◽  
Label Free ◽  
Force Microscopy ◽  
Label Free Detection

Schematic illustration of photo-induced force microscopy combine principal component analysis detected and distinguish single molecule particles of biotoxins AT, RT/ETX with label-free.

Effect of Gamma Radiation on ZnO Doped PVA Nanocomposite Thin Films for Escherichia coli Sensor

2015 ◽  
Vol 1107 ◽  
pp. 687-692 ◽  
Author(s):  
Noor Azwen Noor Azmy ◽  
Huda Abdullah ◽  
Norshafadzila Mohammad Naim ◽  
Aidil Abdul Hamid ◽  
Sahbudin Shaari ◽  
...  
Keyword(s):  
Thin Films ◽  
Escherichia Coli ◽  
Atomic Force Microscopy ◽  
Gamma Radiation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage ◽  
Nanocomposite Thin Films

The effect of gamma radiation on fabricated ZnO doped PVA nanocomposite thin films for determination of Escherichia coli has been investigated. Thin films of ZnO doped PVA were exposed to 60Co γ-radiation source at difference dose rate, ranging from 0 to 30 kGy at room temperature. The structural, morphological and electrical properties of the sample were investigated using X-ray diffraction (XRD), Atomic force microscopy (AFM) and Current-voltage (I-V) measurement. The X-ray diffraction (XRD) spectra have been performed to see the formation of crystal phases of all pure ZnO thin films. The diffraction patterns reveal the good crystalline quality and indicate the crystallization of the ZnO-PVA films strongly depends on radiation dose. The roughness of the thin film surface which can be seen by conducting Atomic force microscopy (AFM) measurement became smoother as the gamma radiation increased. The presence of Escherichia coli as a bacterial contamination in water was identified by measuring the changes of conductivity of thin films using current–voltage (I-V) measurement. The sensitivity of the sensors has been observed to be higher at a higher radiation dose.

Sign in / Sign up

Export Citation Format

Share Document