Specular electron scattering in metallic thin films

Author(s):  
W. F. Egelhoff ◽  
P. J. Chen ◽  
C. J. Powell ◽  
D. Parks ◽  
G. Serpa ◽  
...  
Author(s):  
Hua Dong ◽  
Ranran Chen ◽  
Yongqiang Mu ◽  
Shouting Liu ◽  
Jingkui Zhang ◽  
...  

The thermal transport in metallic thin films can be reduced by the electron scattering and there are very little available knowledge that can be used to explain the mechanism. In this work, we characterized the thermal and electron transport of 3.2 nm thin gold films coated on alginate fiber by the transient electrothermal (TET) technique. The results reveal that the thermal and electrical conductivities are reduced significantly from the respective values of bulk material by 76.2% and 93.9%. At the same time, the Lorenz number is calculated as 8.66 × 10−8 W Ω K−2 and it is almost three times increased from the value of bulk material. The intrinsic thermal diffusivity of alginate fiber is 3.25 × 10−7 m2 s−1 and the thermal conductivity is 0.51 W m−1 K−1.


Author(s):  
R. H. Geiss

The theory and practical limitations of micro area scanning transmission electron diffraction (MASTED) will be presented. It has been demonstrated that MASTED patterns of metallic thin films from areas as small as 30 Åin diameter may be obtained with the standard STEM unit available for the Philips 301 TEM. The key to the successful application of MASTED to very small area diffraction is the proper use of the electron optics of the STEM unit. First the objective lens current must be adjusted such that the image of the C2 aperture is quasi-stationary under the action of the rocking beam (obtained with 40-80-160 SEM settings of the P301). Second, the sample must be elevated to coincide with the C2 aperture image and its image also be quasi-stationary. This sample height adjustment must be entirely mechanical after the objective lens current has been fixed in the first step.


2013 ◽  
Vol 114 (18) ◽  
pp. 183713 ◽  
Author(s):  
G. Rey ◽  
C. Ternon ◽  
M. Modreanu ◽  
X. Mescot ◽  
V. Consonni ◽  
...  

1989 ◽  
Vol 174 ◽  
pp. 11-24 ◽  
Author(s):  
S. Schneider ◽  
H. Schröder ◽  
K. Samwer ◽  
B. Schuhmacher ◽  
U. Köster

1996 ◽  
Vol 2 (3) ◽  
pp. 231-258 ◽  
Author(s):  
Dimitrios Maroudas ◽  
Matthew N. Enmark ◽  
Cora M. Leibig ◽  
Sokrates T. Pantelides

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