Electron scattering mechanisms in fluorine-doped SnO2 thin films

2013 ◽  
Vol 114 (18) ◽  
pp. 183713 ◽  
Author(s):  
G. Rey ◽  
C. Ternon ◽  
M. Modreanu ◽  
X. Mescot ◽  
V. Consonni ◽  
...  
2019 ◽  
Vol 126 (3) ◽  
pp. 035701 ◽  
Author(s):  
Dylan C. Hamilton ◽  
Elisabetta Arca ◽  
Jie Pan ◽  
Sebastian Siol ◽  
Matthew Young ◽  
...  

1999 ◽  
Vol 09 (PR8) ◽  
pp. Pr8-643-Pr8-650 ◽  
Author(s):  
M. Amjoud ◽  
F. Maury
Keyword(s):  

2016 ◽  
Vol 12 (3) ◽  
pp. 4394-4399
Author(s):  
Sura Ali Noaman ◽  
Rashid Owaid Kadhim ◽  
Saleem Azara Hussain

Tin Oxide and Indium doped Tin Oxide (SnO2:In) thin films were deposited on glass and Silicon  substrates  by  thermal evaporation technique.  X-ray diffraction pattern of  pure SnO2 and SnO2:In thin films annealed at 650oC and the results showed  that the structure have tetragonal phase with preferred orientation in (110) plane. AFM studies showed an inhibition of grain growth with increase in indium concentration. SEM studies of pure  SnO2 and  Indium doped tin oxide (SnO2:In) ) thin films showed that the films with regular distribution of particles and they have spherical shape.  Optical properties such as  Transmission , optical band-gap have been measured and calculated.


2011 ◽  
Vol 324 (1) ◽  
pp. 98-102 ◽  
Author(s):  
Zhen Zhu ◽  
Jin Ma ◽  
Lingyi Kong ◽  
Caina Luan ◽  
Qiaoqun Yu
Keyword(s):  

2021 ◽  
Vol 286 ◽  
pp. 129239
Author(s):  
Rahul Prajesh ◽  
Ravindra Kumar Jha ◽  
Vikas Saini ◽  
Mohd Nahid ◽  
Vinay Goyal ◽  
...  

2015 ◽  
Vol 155 ◽  
pp. 109-113 ◽  
Author(s):  
Adel H. Omran Alkhayatt ◽  
Shymaa K. Hussian
Keyword(s):  

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