Characterization of field emission cathodes with different forms of diamond coatings

1999 ◽  
Vol 17 (2) ◽  
pp. 666 ◽  
Author(s):  
V. V. Zhirnov ◽  
O. M. Küttel ◽  
O. Gröning ◽  
A. N. Alimova ◽  
P. Y. Detkov ◽  
...  
Keyword(s):  
Field Emission ◽  
Diamond Coatings ◽  
Field Emission Cathodes

Characterization of field-emission cathodes based on graphene films on SiC

2015 ◽  
Vol 49 (9) ◽  
pp. 1242-1245 ◽  
Author(s):  
R. V. Konakova ◽  
O. B. Okhrimenko ◽  
A. M. Svetlichnyi ◽  
O. A. Ageev ◽  
E. Yu. Volkov ◽  
...  
Keyword(s):  
Field Emission ◽  
Graphene Films ◽  
Field Emission Cathodes

Similarities and Differences between Two Researches in Field Electron Emission: A Way to Develop a More Powerful Electron Source

2020 ◽  
Vol 13 (2) ◽  
pp. 171-179
Keyword(s):  
Thin Film ◽  
Field Emission ◽  
Electron Emission ◽  
Electron Source ◽  
Field Electron Emission ◽  
Hot Electron ◽  
Similarities And Differences ◽  
Field Emission Cathodes ◽  
Powerful Electron

Abstract: This paper discusses the similarities and differences between two studies that deal with resin-coated field-emission cathodes. The two works that are compared within this paper are entitled: Hot Electron Emission from Composite-Insulator Micropoint Cathodes and Methods of Preparation and Characterization of Experimental Field- Emission Cathodes. Within the text, both studies are reviewed and put into context, pointing out and commenting the advantageous features of this type of cathodes. The comparison focuses mainly on the method of preparation including deposition of a thin film on the cathode tip and the characterization of the coating itself. The effect of the coating on the field emission is discussed as well. Keywords: Cold field emission, Epoxylite 478, Epoxylite EPR-4.

TEM characterization of silicon epitaxial layer grown on Si-TaS2, eutectic composites

1991 ◽  
Vol 49 ◽  
pp. 802-803
Author(s):  
C.M. Sung ◽  
M. Levinson ◽  
M. Tabasky ◽  
K. Ostreicher ◽  
B.M. Ditchek
Keyword(s):  
Substrate Surface ◽  
Bulk Sample ◽  
Surface Cleaning ◽  
Native Oxide ◽  
Czochralski Growth ◽  
Ion Milling ◽  
Cross Sectional ◽  
Cleaning Methods ◽  
Field Emission Cathodes

Directionally solidified Si/TaSi2 eutectic composites for the development of electronic devices (e.g. photodiodes and field-emission cathodes) were made using a Czochralski growth technique. High quality epitaxial growth of silicon on the eutectic composite substrates requires a clean silicon substrate surface prior to the growth process. Hence a preepitaxial surface cleaning step is highly desirable. The purpose of this paper is to investigate the effect of surface cleaning methods on the epilayer/substrate interface and the characterization of silicon epilayers grown on Si/TaSi2 substrates by TEM.Wafers were cut normal to the <111> growth axis of the silicon matrix from an approximately 1 cm diameter Si/TaSi2 composite boule. Four pre-treatments were employed to remove native oxide and other contaminants: 1) No treatment, 2) HF only; 3) HC1 only; and 4) both HF and HCl. The cross-sectional specimens for TEM study were prepared by cutting the bulk sample into sheets perpendicular to the TaSi2 fiber axes. The material was then prepared in the usual manner to produce samples having a thickness of 10μm. The final step was ion milling in Ar+ until breakthrough occurred. The TEM samples were then analyzed at 120 keV using the Philips EM400T.

CHARACTERIZATION OF ENHANCED FIELD EMISSION SITES ON NIOBIUM SURFACES DUE TO HEAT TREATMENT

1986 ◽  
Vol 47 (C7) ◽  
pp. C7-133-C7-138 ◽  
Author(s):  
N. SANKARRAMAN ◽  
Ph. NIEDERMANN ◽  
R. J. NOER ◽  
O. FISCHER
Keyword(s):  
Heat Treatment ◽  
Field Emission
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