Investigation of Ta–RuO[sub 2] diffusion barrier for high density memory capacitor applications
1998 ◽
Vol 16
(6)
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pp. 3059
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2002 ◽
Vol 12
(5)
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pp. 373
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Keyword(s):
2004 ◽
Vol 83
(4)
◽
pp. 949-951
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2008 ◽
Vol 3
(0)
◽
pp. S1047-S1047
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2000 ◽
Vol 31
(1-4)
◽
pp. 351-358
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2002 ◽
Vol 27
(3-4)
◽
pp. 143-226
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Keyword(s):
2002 ◽
Vol 49
(11)
◽
pp. 1917-1927
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Keyword(s):