Enhanced degradation of gate oxide in negative-gas plasma during reactive ion etching
1998 ◽
Vol 16
(2)
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pp. 670
2007 ◽
Vol 25
(2)
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pp. 391-400
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Keyword(s):
2003 ◽
Vol 169-170
◽
pp. 203-207
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Keyword(s):
2001 ◽
Vol 2
(3-4)
◽
pp. 563-569
◽
Keyword(s):