scholarly journals Interface roughness effects on transport in tunnel structures

1996 ◽  
Vol 14 (4) ◽  
pp. 2790 ◽  
Author(s):  
D. Z.-Y. Ting
Keyword(s):  
Interface Roughness ◽  
Roughness Effects

Interface roughness effects in Gaussian superlattices

2001 ◽  
Vol 16 (5) ◽  
pp. 304-309 ◽  
Author(s):  
Francesco Banfi ◽  
Vittorio Bellani ◽  
Ignacio Gómez ◽  
Enrique Diez ◽  
Francisco Domínguez-Adame
Keyword(s):  
Interface Roughness ◽  
Roughness Effects

scholarly journals Interface Roughness Effects in Ultra-Thin Tunneling Oxides

VLSI Design ◽  
1998 ◽  
Vol 8 (1-4) ◽  
pp. 47-51 ◽  
Author(s):  
D. Z.-Y. Ting ◽  
Erik S. Daniel ◽  
T. C. Mcgill
Keyword(s):  
Silicon Oxide ◽  
Theoretical Study ◽  
Interface Roughness ◽  
Oxide Interface ◽  
Roughness Effects ◽  
Direct Tunneling ◽  
Silicon Based

Advanced MOSFET for ULSI and novel silicon-based devices require the use of ultrathin tunneling oxides where non-uniformity is often present. We report on our theoretical study of how tunneling properties of ultra-thin oxides are affected by roughness at the silicon/oxide interface. The effect of rough interfacial topography is accounted for by using the Planar Supercell Stack Method (PSSM) which can accurately and efficiently compute scattering properties of 3D supercell structures. Our results indicate that while interface roughness effects can be substantial in the direct tunneling regime, they are less important in the Fowler-Nordheim regime.

Interface roughness effects on the performance of magnetic tunnel junctions

2007 ◽  
Vol 515 (7-8) ◽  
pp. 3941-3945 ◽  
Author(s):  
Zongzhi Zhang ◽  
Hui Zhao ◽  
Yang Ren ◽  
B. Ma ◽  
Q.Y. Jin
Keyword(s):  
Tunnel Junctions ◽  
Magnetic Tunnel Junctions ◽  
Interface Roughness ◽  
Roughness Effects

scholarly journals Surface/interface roughness effects on magneto-electrical properties of thin films

2002 ◽  
Vol 507-510 ◽  
pp. 541-545 ◽  
Author(s):  
G. Palasantzas ◽  
J.Th.M. De Hosson ◽  
J. Barnas
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Interface Roughness ◽  
Roughness Effects

Interface Roughness Effects in Resonant Tunneling Structures

1997 ◽  
Vol 164 (1) ◽  
pp. 137-140 ◽  
Author(s):  
Y. Galvão ◽  
A.L.C. Triques ◽  
P. A. Schulz
Keyword(s):  
Resonant Tunneling ◽  
Interface Roughness ◽  
Roughness Effects
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