Atomic force microscopy for cross section inspection and metrology

1996 ◽  
Vol 14 (6) ◽  
pp. 4004 ◽  
Author(s):  
Kathryn Wilder
Keyword(s):  
Atomic Force Microscopy ◽  
Cross Section ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Applications of Atomic Force Microscopy in Textiles

2015 ◽  
Vol 10 (1) ◽  
pp. 155892501501000
Author(s):  
Serpil Koral Koc
Keyword(s):  
Atomic Force Microscopy ◽  
Cross Section ◽  
Cross Sections ◽  
Phase Imaging ◽  
Cotton Wool ◽  
Synthetic Fibers ◽  
Force Microscopy ◽  
Fiber Properties ◽  
Atomic Force ◽  
Potential Applications

Potential applications of atomic force microscopy (AFM) in textiles are explained. For this purpose samples were carefully selected from both natural and synthetic fibers. Cotton, wool, conventional polyethylene terepthalate (PET), antibacterial PET, and antistatic PET were investigated by means of 3D topography imaging, phase imaging, and calculation of their Rq values. The distribution of the additives in the cross sections of antibacterial PET and antistatic PET were analyzed. Moreover, differences between inner and outer cross section of trilobal PET was observed by force spectroscopy. The results are discussed considering the fiber properties. It is concluded that AFM is a powerful tool to investigate different properties of textile fibers, and it gives valuable information.

A Method for Calculating the Spring Constant of Atomic Force Microscopy Cantilevers with a Nonrectangular Cross Section

2005 ◽  
Vol 77 (4) ◽  
pp. 1192-1195 ◽  
Author(s):  
Mark A. Poggi ◽  
Andrew W. McFarland ◽  
Jonathan S. Colton ◽  
Lawrence A. Bottomley
Keyword(s):  
Atomic Force Microscopy ◽  
Cross Section ◽  
Spring Constant ◽  
Force Microscopy ◽  
Atomic Force

Nanomechanical characterization of porous materials by atomic force microscopy

MRS Advances ◽  
2018 ◽  
Vol 3 (44) ◽  
pp. 2719-2724
Author(s):  
D.L.P. Lacerda ◽  
F. Ptak ◽  
R. Prioli
Keyword(s):  
Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Cross Section ◽  
Elastic Moduli ◽  
Wide Distribution ◽  
Acoustic Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scanning Electron

AbstractAtomic force microscopy (AFM) and nanoindentation were used to characterize poly (methyl methacrylate) (PMMA) films with a wide distribution of pores. Pores with diameters ranging from tens of nanometers to few micrometers were measured by AFM and cross-section scanning electron microscopy (SEM). Atomic force acoustic microscopy (AFAM) mapping of the elastic modulus were correlated with the samples topography and pore distribution. The elastic moduli of the samples were additionally measured by nanoindentation.

Young's Modulus Mapping on Hair Cross-Section by Atomic Force Microscopy

2009 ◽  
Vol 16 (1) ◽  
pp. 1-12 ◽  
Author(s):  
Hiroki Kitano ◽  
Aiko Yamamoto ◽  
Masanao Niwa ◽  
So Fujinami ◽  
Ken Nakajima ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Young’S Modulus ◽  
Cross Section ◽  
Young's Modulus ◽  
Force Microscopy ◽  
Atomic Force

Novel Method for High-Spatial-Resolution Chemical Analysis of Buried Polymer-Metal Interface: Atomic Force Microscopy-Infrared (AFM-IR) Spectroscopy with Low-Angle Microtomy

2021 ◽  
pp. 000370282110071
Author(s):  
Naoki Baden
Keyword(s):  
Atomic Force Microscopy ◽  
Ir Spectroscopy ◽  
Chemical Analysis ◽  
Cross Section ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Polymer Metal ◽  
Metal Interfaces

There is a great need for the analysis of the chemical composition, structure, functional groups, and interactions at polymer-metal interfaces in terms of adhesion, corrosion, and insulation. Although atomic force microscopy-based infrared (AFM-IR) spectroscopy can provide chemical analysis with nanoscale spatial resolution, it generally requires to thin a sample to be placed on a substrate that has low absorption of infrared light and high thermal conductivity, which is often difficult for samples that contain hard materials such as metals. This study demonstrates that the combination of AFM-IR with low-angle microtomy (LAM) sample preparation can analyze buried polymer-metal interfaces with higher spatial resolution than that with the conventional sample preparation of a thick vertical cross-section. In the LAM of a polymer layer on a metal substrate, the polymer layer is tapered to be thin in the vicinity of the interface, and thus, sample thinning is not required. An interface between an epoxyacrylate layer and copper wire in a flexible printed circuit cable was measured using this method. A carboxylate interphase layer with a thickness of ∼130 nm was clearly visualized at the interface, and its spectrum was obtained without any signal contamination from the neighboring epoxyacrylate, which was difficult to achieve on a thick vertical cross-section. The combination of AFM-IR with LAM is a simple and useful method for high-spatial-resolution chemical analysis of buried polymer-metal interfaces.

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