Fabrication of sharp-needled conical polymer tip on the cross-section of optical fiber via two-photon polymerization for tuning-fork-based atomic force microscopy

2013 ◽  
Vol 286 ◽  
pp. 197-203 ◽  
Author(s):  
Byung Je Jung ◽  
Hong Jin Kong ◽  
Yong-Hoon Cho ◽  
Kyu-Seung Lee ◽  
Chung Hyun Park ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Fiber ◽  
Cross Section ◽  
Tuning Fork ◽  
Force Microscopy ◽  
Two Photon ◽  
Atomic Force ◽  
The Cross ◽  
Two Photon Polymerization

A Self-Sensitive Probe Composed of a Piezoelectric Tuning Fork and a Bent Optical Fiber Tip for Scanning Near-field Optical/Atomic Force Microscopy

1997 ◽  
Vol 36 (Part 1, No. 9A) ◽  
pp. 5753-5758 ◽  
Author(s):  
Hiroshi Muramatsu ◽  
Noritaka Yamamoto ◽  
Takeshi Umemoto ◽  
Katsunori Homma ◽  
Norio Chiba ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Fiber ◽  
Tuning Fork ◽  
Near Field ◽  
Force Microscopy ◽  
Atomic Force

Tailored probes for atomic force microscopy fabricated by two-photon polymerization

2016 ◽  
Vol 109 (6) ◽  
pp. 063101 ◽  
Author(s):  
Gerald Göring ◽  
Philipp-Immanuel Dietrich ◽  
Matthias Blaicher ◽  
Swati Sharma ◽  
Jan G. Korvink ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Two Photon ◽  
Atomic Force ◽  
Two Photon Polymerization

Tip-Substrate Shear Interaction in Quartz Tuning Fork-Based Atomic Force Microscopy in Air

2021 ◽  
Vol 71 (5) ◽  
pp. 439-445
Author(s):  
Hyoju CHOE ◽  
Dongwon KIM ◽  
Manhee LEE* ◽  
Myungchul CHOI
Keyword(s):  
Atomic Force Microscopy ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals The Model Analysis of a Complex Tuning Fork Probe and Its Application in Bimodal Atomic Force Microscopy

2017 ◽  
Vol 7 (2) ◽  
pp. 121
Author(s):  
Zhichao Wu ◽  
Tong Guo ◽  
Ran Tao ◽  
Linyan Xu ◽  
Jinping Chen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Tuning Fork ◽  
Model Analysis ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Applications of Atomic Force Microscopy in Textiles

2015 ◽  
Vol 10 (1) ◽  
pp. 155892501501000
Author(s):  
Serpil Koral Koc
Keyword(s):  
Atomic Force Microscopy ◽  
Cross Section ◽  
Cross Sections ◽  
Phase Imaging ◽  
Cotton Wool ◽  
Synthetic Fibers ◽  
Force Microscopy ◽  
Fiber Properties ◽  
Atomic Force ◽  
Potential Applications

Potential applications of atomic force microscopy (AFM) in textiles are explained. For this purpose samples were carefully selected from both natural and synthetic fibers. Cotton, wool, conventional polyethylene terepthalate (PET), antibacterial PET, and antistatic PET were investigated by means of 3D topography imaging, phase imaging, and calculation of their Rq values. The distribution of the additives in the cross sections of antibacterial PET and antistatic PET were analyzed. Moreover, differences between inner and outer cross section of trilobal PET was observed by force spectroscopy. The results are discussed considering the fiber properties. It is concluded that AFM is a powerful tool to investigate different properties of textile fibers, and it gives valuable information.

Atomic force microscopy of nickel dot arrays with tuning fork and nanotube probe

2003 ◽  
Vol 21 (1) ◽  
pp. 323 ◽  
Author(s):  
S. Rozhok ◽  
S. Jung ◽  
V. Chandrasekhar ◽  
Xiwei Lin ◽  
Vinayak P. Dravid
Keyword(s):  
Atomic Force Microscopy ◽  
Tuning Fork ◽  
Force Microscopy ◽  
Atomic Force
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